参数资料
型号: MC9S12DP512MPV
厂商: MOTOROLA INC
元件分类: 微控制器/微处理器
英文描述: 16-BIT, FLASH, 25 MHz, MICROCONTROLLER, PQFP112
封装: LQFP-112
文件页数: 4/124页
文件大小: 1963K
代理商: MC9S12DP512MPV
MC9S12DP512 Device Guide V01.21
101
A.3.2 NVM Reliability
The reliability of the NVM blocks is guaranteed by stress test during qualification, constant process
monitors and burn-in to screen early life failures.
The failure rates for data retention and program/erase cycling are specified at the operating conditions
noted.
The program/erase cycle count on the sector is incremented every time a sector or mass erase event is
executed.
Table A-12 NVM Reliability Characteristics
Conditions are shown in Table A-4 unless otherwise noted
Num C
Rating
Symbol
Min
Typ
Max
Unit
1C
Data Retention at an average junction temperature of
TJavg = 70°C
tNVMRET
15
-
Years
2
C Flash number of Program/Erase cycles
nFLPE
10,000
-
Cycles
3C
EEPROM number of Program/Erase cycles
(–40
°C
T
J 0°C)
nEEPE
10,000
-
Cycles
4C
EEPROM number of Program/Erase cycles
(0
°C < T
J 140°C)
nEEPE
100,000
-
Cycles
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