参数资料
型号: MCF52256CAG66
厂商: FREESCALE SEMICONDUCTOR INC
元件分类: 微控制器/微处理器
英文描述: 32-BIT, FLASH, 66 MHz, RISC MICROCONTROLLER, PQFP144
封装: 20 X 20 MM, ROHS COMPLIANT, LQFP-144
文件页数: 22/46页
文件大小: 560K
代理商: MCF52256CAG66
MCF52259 ColdFire Microcontroller, Rev. 4
Electrical Characteristics
Freescale Semiconductor
29
2.5
EzPort Electrical Specifications
2.6
ESD Protection
2 Reprogramming of a flash memory array block prior to erase is not required.
Table 11. EzPort Electrical Specifications
Name
Characteristic
Min
Max
Unit
EP1
EPCK frequency of operation (all commands except READ)
fsys / 2
MHz
EP1a
EPCK frequency of operation (READ command)
fsys / 8
MHz
EP2
EPCS_b negation to next EPCS_b assertion
2 × Tcyc
—ns
EP3
EPCS_B input valid to EPCK high (setup)
5
ns
EP4
EPCK high to EPCS_B input invalid (hold)
5
ns
EP5
EPD input valid to EPCK high (setup)
2
ns
EP6
EPCK high to EPD input invalid (hold)
5
ns
EP7
EPCK low to EPQ output valid (out setup)
12
ns
EP8
EPCK low to EPQ output invalid (out hold)
0
ns
EP9
EPCS_B negation to EPQ tri-state
12
ns
Table 12. ESD Protection Characteristics1, 2
1 All ESD testing is in conformity with CDF-AEC-Q100 Stress Test Qualification for
Automotive Grade Integrated Circuits.
2 A device is defined as a failure if after exposure to ESD pulses the device no longer
meets the device specification requirements. Complete DC parametric and functional
testing is performed per applicable device specification at room temperature followed by
hot temperature, unless specified otherwise in the device specification.
Characteristics
Symbol
Value
Units
ESD target for Human Body Model
HBM
2000
V
ESD target for Machine Model
MM
200
V
HBM circuit description
Rseries
1500
C
100
pF
MM circuit description
Rseries
0
C
200
pF
Number of pulses per pin (HBM)
Positive pulses
Negative pulses
1
Number of pulses per pin (MM)
Positive pulses
Negative pulses
3
Interval of pulses
1
sec
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