参数资料
型号: MIC5011YM TR
厂商: Micrel Inc
文件页数: 3/12页
文件大小: 0K
描述: IC DRIVER MOSF HI/LOW SIDE 8SOIC
标准包装: 2,500
配置: 高端或低端
输入类型: 非反相
延迟时间: 25µs
配置数: 1
输出数: 1
电源电压: 4.75 V ~ 32 V
工作温度: -40°C ~ 85°C
安装类型: 表面贴装
封装/外壳: 8-SOIC(0.154",3.90mm 宽)
供应商设备封装: 8-SOIC
包装: 带卷 (TR)
其它名称: MIC5011YMTR
MIC5011YMTR-ND
MIC5011
Electrical Characteristics (Note 3)
Test circuit. T A = –55°C to +125°C, V + = 15V, all switches open, unless otherwise speci?ed.
Micrel, Inc.
Parameter
Conditions
Min
Typical
Max
Units
Supply Current, I 1
Logic Input Voltage
Logic Input Current, I 2
Input Capacitance
V + = 32V
V + = 5V
V + = 4.75V
V + = 15V
V + = 32V
Pin 2
V IN = 0V, S2 closed
V IN = V + = 32V
V IN = 5V, S2 closed
Adjust V IN for V GATE low
Adjust V IN for V GATE high
Adjust V IN for V GATE high
V IN = 0V
V IN = 32V
4.5
5.0
–1
0.1
8
1.6
5
10
20
4
2
1
μA
mA
mA
V
V
V
μA
μA
pF
Gate Drive, V GATE
Zener Clamp,
V GATE – V SOURCE
Gate Turn-on Time, t ON
(Note 4)
Gate Turn-off Time, t OFF
S1, S2 closed, V + = 4.75V, I GATE = 0, V IN = 4.5V
V S = V+, V IN = 5V V + = 15V, I GATE = 100μA, V IN = 5V
S2 closed, V IN = 5V V + = 15V, V S = 15V
V + = 32V, V S = 32V
V IN switched from 0 to 5V; measure time
for V GATE to reach 20V
V IN switched from 5 to 0V; measure time
for V GATE to reach 1V
7
24
11
11
10
27
12.5
13
25
4
15
16
50
10
V
V
V
V
μs
μs
Note 1
Note 2
Note 3
Note 4
Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Electrical speci?cations do not apply when
operating the device beyond its speci?ed Operating Ratings .
The MIC5011 is ESD sensitive.
Minimum and maximum Electrical Characteristics are 100% tested at T A = 25°C and T A = 85°C, and 100% guaranteed over the entire
range. Typicals are characterized at 25°C and represent the most likely parametric norm.
Test conditions re?ect worst case high-side driver performance. Low-side and bootstrapped topologies are signi?cantly faster—see Appli-
cations Information . Maximum value of switching speed seen at 125°C, units operated at room temperature will re?ect the typical values
shown.
Test Circuit
V+
V IN
+ 1μF
500Ω
1W
MIC5011
1 V+ C1 8
2 Input Com 7
3 Source C2 6
4 Gnd Gate 5
1nF
1nF
V GATE
S2
VS
1nF S1
I5
July 2005
3
MIC5011
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