参数资料
型号: MSC7116VM800
厂商: Freescale Semiconductor
文件页数: 13/60页
文件大小: 0K
描述: IC DSP PROCESSOR 16BIT 400MAPBGA
标准包装: 90
系列: StarCore
类型: SC1400 内核
接口: 主机接口,I²C,UART
时钟速率: 200MHz
非易失内存: 外部
芯片上RAM: 400kB
电压 - 输入/输出: 3.30V
电压 - 核心: 1.20V
工作温度: -40°C ~ 105°C
安装类型: 表面贴装
封装/外壳: 400-LFBGA
供应商设备封装: 400-MAPBGA(17x17)
包装: 托盘
MSC7116 Data Sheet, Rev. 13
Electrical Characteristics
Freescale Semiconductor
20
Table 6 lists the DDR DRAM capacitance.
Tri-state (high impedance off state) leakage current,
VIN = VDDIO
IOZ
–1.0
0.09
1
A
Signal low input current, VIL = 0.4 V
IL
–1.0
0.09
1
A
Signal high input current, VIH = 2.0 V
IH
–1.0
0.09
1
A
Output high voltage, IOH = –2 mA, except open drain pins
VOH
2.0
3.0
V
Output low voltage, IOL= 5 mA
VOL
—0
0.4
V
Typical power at 266 MHz5
P
293.0
mW
Notes:
1.
The value of VDDM at the MSC7116 device must remain within 50 mV of VDDM at the DRAM device at all times.
2.
VREF must be equal to 50% of VDDM and track VDDM variations as measured at the receiver. Peak-to-peak noise must not
exceed ±2% of the DC value.
3.
VTT is not applied directly to the MSC7116 device. It is the level measured at the far end signal termination. It should be equal
to VREF. This rail should track variations in the DC level of VREF.
4.
Output leakage for the memory interface is measured with all outputs disabled, 0 V
≤ VOUT ≤ VDDM.
5.
The core power values were measured.using a standard EFR pattern at typical conditions (25°C, 300 MHz, 1.2 V core).
Table 6. DDR DRAM Capacitance
Parameter/Condition
Symbol
Max
Unit
Input/output capacitance: DQ, DQS
CIO
30
pF
Delta input/output capacitance: DQ, DQS
CDIO
30
pF
Note:
These values were measured under the following conditions:
VDDM = 2.5 V ± 0.125 V
f = 1 MHz
TA = 25°C
VOUT = VDDM/2
VOUT (peak to peak) = 0.2 V
Table 5. DC Electrical Characteristics (continued)
Characteristic
Symbol
Min
Typical
Max
Unit
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