参数资料
型号: N08L63W2AB27I
厂商: ON Semiconductor
文件页数: 5/10页
文件大小: 0K
描述: IC SRAM 4MBIT 70NS 48BGA
产品变化通告: Product Obsolescence 14/Apr/2010
标准包装: 220
格式 - 存储器: RAM
存储器类型: SRAM - 异步
存储容量: 4M (256K x 16)
速度: 70ns
接口: 并联
电源电压: 2.3 V ~ 3.6 V
工作温度: -40°C ~ 85°C
封装/外壳: 48-LFBGA
供应商设备封装: 48-BGA(6x8)
包装: 托盘
其它名称: 766-1040
N08L63W2A
Timing Test Conditions
Item
Timing
Input Pulse Level
Input Rise and Fall Time
Input and Output Timing Reference Levels
Output Load
Operating Temperature
0.1V CC to 0.9 V CC
5ns
0.5 V CC
CL = 30pF
-40 to +85 o C
Item
Read Cycle Time
Address Access Time (Random Access)
Address Access Time (Page Mode)
Chip Enable to Valid Output
Output Enable to Valid Output
Byte Select to Valid Output
Chip Enable to Low-Z output
Output Enable to Low-Z Output
Byte Select to Low-Z Output
Symbol
t RC
t AA
t AAP
t CO
t OE
t LB , t UB
t LZ
t OLZ
t LBZ , t UBZ
2.3 - 3.6 V
Min. Max.
85
85
30
85
30
85
10
5
10
2.7 - 3.6 V
Min. Max.
70
70
25
70
25
70
10
5
10
Units
ns
ns
ns
ns
ns
ns
ns
ns
ns
Chip Disable to High-Z Output
Output Disable to High-Z Output
Byte Select Disable to High-Z Output
t HZ
t OHZ
t LBHZ , t UBHZ
0
0
0
20
20
20
0
0
0
20
20
20
ns
ns
ns
Output Hold from Address Change
Write Cycle Time
Chip Enable to End of Write
Address Valid to End of Write
Byte Select to End of Write
Write Pulse Width
Address Setup Time
Write Recovery Time
Write to High-Z Output
Data to Write Time Overlap
Data Hold from Write Time
End Write to Low-Z Output
t OH
t WC
t CW
t AW
t LBW , t UBW
t WP
t AS
t WR
t WHZ
t DW
t DH
t OW
5
85
50
50
50
40
0
0
40
0
5
20
5
70
50
50
50
40
0
0
40
0
5
20
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
Rev. 8 | Page 5 of 10 | www.onsemi.com
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