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参数资料
| 型号： | PUMA77S4000AI-025 |
| 英文描述： | 128 MC CPLD,5 V ISP CPLD,100 PIN PQFP(EPLD) |
| 中文描述： | X32号的SRAM模块 |
| 文件页数： | 10/10页 |
| 文件大小： | 339K |
| 代理商： | PUMA77S4000AI-025 |
PUMA2/67/77S4000/A-020/025/35
Issue 4.3 : December 1999
9
Military Screening Procedure
MultiChip Screening Flow for high reliability product is in accordance with Mil-883 method 5004 .
SCREENING
MB MULTICHIP MODULE SCREENING FLOW
SCREEN
TEST METHOD
LEVEL
Visual and Mechanical
Internal visual
2010 Condition B or manufacturers equivalent
100%
Temperature cycle
1010 Condition C (10 Cycles,-65oC to +150oC)
100%
Constant acceleration
2001 Condition B (Y1 & Y2) (10,000g)
100%
Burn-In
Pre-Burn-in electrical
Per applicable device specifications at T
A=+25
oC
100%
Burn-in
T
A=+125
oC,160hrs minimum.
100%
Final Electrical Tests
Per applicable Device Specification
Static (DC)
a) @ T
A=+25
oC and power supply extremes
100%
b) @ temperature and power supply extremes
100%
Functional
a) @ T
A=+25
oC and power supply extremes
100%
b) @ temperature and power supply extremes
100%
Switching (AC)
a) @ T
A=+25
oC and power supply extremes
100%
b) @ temperature and power supply extremes
100%
Percent Defective allowable (PDA)
Calculated at post-burn-in at T
A=+25
oC
10%
Hermeticity
1014
Fine
Condition A
100%
Gross
Condition C
100%
Quality Conformance
Per applicable Device Specification
Sample
External Visual
2009 Per vendor or customer specification
100%
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相关PDF资料 |
PDF描述 |
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| PUMA77S4000AI-35 | 15NS, 100 TQFP, COM TEMP(EPLD) |
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| PUMA77S4000AL-025 | 15NS, 100 PQFP, COM TEMP(EPLD) |
| PUMA77S4000AL-35 | 15NS, 160 PQFP, IND TEMP(EPLD) |
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