参数资料
型号: SI3424BDV-T1-E3
厂商: Vishay Siliconix
文件页数: 2/11页
文件大小: 0K
描述: MOSFET N-CH 30V 8A 6TSOP
标准包装: 3,000
系列: TrenchFET®
FET 型: MOSFET N 通道,金属氧化物
FET 特点: 标准
漏极至源极电压(Vdss): 30V
电流 - 连续漏极(Id) @ 25° C: 8A
开态Rds(最大)@ Id, Vgs @ 25° C: 28 毫欧 @ 7A,10V
Id 时的 Vgs(th)(最大): 3V @ 250µA
闸电荷(Qg) @ Vgs: 19.6nC @ 10V
输入电容 (Ciss) @ Vds: 735pF @ 15V
功率 - 最大: 2.98W
安装类型: 表面贴装
封装/外壳: 6-TSOP(0.065",1.65mm 宽)
供应商设备封装: 6-TSOP
包装: 带卷 (TR)
Si3424BDV
Vishay Siliconix
SPECIFICATIONS (T J = 25 °C, unless otherwise noted)
Parameter
Symbol
Test Conditions
Min.
Typ.
Max.
Unit
Static
Drain-Source Breakdown Voltage
V DS Temperature Coefficient
V GS(th) Temperature Coefficient
V DS
? V DS /T J
? V GS(th) /T J
V GS = 0 V, I D = 250 μA
I D = 250 μA
30
23.75
5.8
V
mV/°C
Gate-Source Threshold Voltage
V GS(th)
V DS = V GS , I D = 250 μA
1
3
V
Gate-Source Leakage
Zero Gate Voltage Drain Current
On-State Drain Current a
I GSS
I DSS
I D(on)
V DS = 0 V, V GS = ± 20 V
V DS = 30 V, V GS = 0 V
V DS = 30 V, V GS = 0 V, T J = 85 °C
V DS = ? 5 V, V GS = 10 V
30
± 100
1
10
nA
μA
A
Drain-Source On-State Resistance a
Forward Transconductance
R DS(on)
g fs
V GS = 10 V, I D = 7 A
V GS = 4.5 V, I D = 5.8 A
V DS = 15 V, I D = 7 A
0.0230
0.0315
17
0.0280
0.0380
?
S
Dynamic b
Input Capacitance
C iss
735
Output Capacitance
Reverse Transfer Capacitance
C oss
C rss
V DS = 15 V, V GS = 0 V, f = 1 MHz
130
34
pF
Total Gate Charge
Gate-Source Charge
Q g
Q gs
V DS = 15 V, V GS = 10 V, I D = 7 A
V DS = 24 V, V GS = 4.5 V, I D = 7 A
13.05
6.2
2.16
19.6
9.3
nC
Gate-Drain Charge
Q gd
2.15
Gate Resistance
Turn-On Delay Time
Rise Time
Turn-Off DelayTime
Fall Time
Turn-On Delay Time
Rise Time
Turn-Off DelayTime
Fall Time
R g
t d(on)
t r
t d(off)
t f
t d(on)
t r
t d(off)
t f
f = 1 MHz
V DD = 15 V, R L = 2.7 ?
I D ? 5.6 A, V GEN = 10 V, R g = 1 ?
V DD = 15 V, R L = 3.2 ?
I D ? 4.7 A, V GEN = 4.5 V, R g = 1 ?
2.45
4.5
10
16
7
18
85
17
12
3.7
6.8
15
24
10.5
27
128
26
18
?
ns
Drain-Source Body Diode Characteristics
Continous Source-Drain Diode Current
Pulse Diode Forward Current a
I S
I SM
T C = 25 °C
2.48
30
A
Body Diode Voltage
Body Diode Reverse Recovery Time
Body Diode Reverse Recovery Charge
Reverse Recovery Fall Time
V SD
t rr
Q rr
t a
I S = 3 A
I F = 3.2 A, dI/dt = 100 A/μs
0.8
13.8
6.21
8.5
1.2
20.7
9.32
V
nC
ns
Reverse Recovery Rise Time
t b
5.3
Notes:
a. Pulse test; pulse width ? 300 μs, duty cycle ? 2 %.
b. Guaranteed by design, not subject to production testing.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
www.vishay.com
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For technical questions, contact: pmostechsupport@vishay.com
Document Number: 74623
S13-0631-Rev. E, 25-Mar-13
This document is subject to change without notice.
THE PRODUCTS DESCRIBED HEREIN AND THIS DOCUMENT ARE SUBJECT TO SPECIFIC DISCLAIMERS, SET FORTH AT www.vishay.com/doc?91000
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