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参数资料
| 型号： | SI4920DY-T1-E3 |
| 厂商： | Vishay Siliconix |
| 文件页数： | 2/8页 |
| 文件大小： | 0K |
| 描述： | MOSFET DUAL N-CH 30V 8-SOIC |
| 标准包装： | 2,500 |
| 系列： | TrenchFET® |
| FET 型： | 2 个 N 沟道（双） |
| FET 特点： | 逻辑电平门 |
| 漏极至源极电压(Vdss)： | 30V |
| 开态Rds（最大）@ Id, Vgs @ 25° C： | 25 毫欧 @ 6.9A，10V |
| Id 时的 Vgs(th)（最大）： | 1V @ 250µA |
| 闸电荷(Qg) @ Vgs： | 23nC @ 5V |
| 安装类型： | 表面贴装 |
| 封装/外壳： | 8-SOIC（0.154"，3.90mm 宽） |
| 供应商设备封装： | 8-SOICN |
| 包装： | 带卷 (TR) |
Si4920DY
Vishay Siliconix
SPECIFICATIONS T J = 25 °C, unless otherwise noted
Parameter
Symbol
Test Conditions
Min.
Typ.
Max.
Unit
Static
Gate Threshold Voltage
Gate-Body Leakage
Zero Gate Voltage Drain Current
On-State Drain Current a
V GS(th)
I GSS
I DSS
I D(on)
V DS = V GS , I D = 250 μA
V DS = 0 V, V GS = ± 20 V
V DS = 30 V, V GS = 0 V
V DS = 30 V, V GS = 0 V, T J = 55 °C
V DS ≥ 5 V, V GS = 10 V
1
20
± 100
1
25
V
nA
μA
A
Drain-Source On-State Resistance a
Forward Transconductance a
R DS(on)
g fs
V GS = 10 V, I D = 6.9 A
V GS = 4.5 V, I D = 5.8 A
V DS = 15 V, I D = 6.9 A
0.020
0.026
25
0.025
0.035
Ω
S
Diode Forward Voltage
a
V SD
I S = 1.7 A, V GS = 0 V
1.2
V
Dynamic b
Gate Charge
Q g
V DS = 15 V, V GS = 5 V, I D = 6.9 A
15
23
Total Gate Charge
Gate-Source Charge
Q gt
Q gs
V DS = 15 V, V GS = 10 V, I D = 6.9 A
30
7.5
50
nC
Gate-Drain Charge
Q gd
3.5
Gate Resistance
Turn-On Delay Time
Rise Time
Turn-Off Delay Time
Fall Time
Source-Drain Reverse Recovery Time
R g
t d(on)
t r
t d(off)
t f
t rr
f = 1 MHz
V DD = 15 V, R L = 15 Ω
I D ? 1 A, V GEN = 10 V, R g = 6 Ω
I F = 1.7 A, dI/dt = 100 A/μs
2
12
10
60
15
50
3
20
20
90
30
90
Ω
ns
Notes:
a. Pulse test; pulse width ≤ 300 μs, duty cycle ≤ 2 %.
b. Guaranteed by design, not subject to production testing.
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional operation
of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect device reliability.
www.vishay.com
2
Document Number: 70667
S09-0767-Rev. E, 04-May-09
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