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参数资料
| 型号： | SM320MCM42CHFNM40 |
| 厂商： | TEXAS INSTRUMENTS INC |
| 元件分类： | 数字信号处理 |
| 英文描述： | 32-BIT, 40 MHz, OTHER DSP, CQFP408 |
| 封装： | TIE-BAR, CERAMIC, QFP-408 |
| 文件页数： | 4/22页 |
| 文件大小： | 358K |
| 代理商： | SM320MCM42CHFNM40 |
SMJ320MCM42C, SMJ320MCM42D
DUAL SMJ320C40 MULTICHIP MODULE
SGKS001D – JULY 1997 – REVISED OCTOBER 2001
12
POST OFFICE BOX 1443
HOUSTON, TEXAS 77251–1443
capacitance
Capacitance of a C40 die is specified by design to be 15 pF maximum for both inputs and outputs. Module
networks add up to 5 pF. Characterization of die or substance capacitance is performed after any design
change. Power measurements taken for a C40 die are made with an additional 80-pF load capacitance. Refer
to the SMJ320C40 data sheet (literature number SGUS017) for the test load circuit.
operational timings and module testing
Texas Instruments processing assures that operation is verified to published data sheet specifications on the
C40 in die form. All voltage, timing, speed, and temperature specifications are met before any die is placed into
a multichip module. For this reason, all C40 voltage and timing parameters at the module level need not be
verified.
Characterization of the 42 substrate shows that the module performs as an equivalent system of discretely
packaged C40 devices. This performance is assured through a full-frequency functional checkout of the module
that verifies selected worst-case timings. An additional propagation delay is introduced by the substrate. This
value is assured by design to be less than 1 ns, but it is not tested. See the SMJ320C40 data sheet (literature
number SGUS017) for a complete listing of timing diagrams and limits.
module test capability (future compatibility)
The C40 supports the IEEE-1149.1 testability standard, and the test access port (TAP) is brought out to the
module footprint. TDI is connected to C40_#1, TDO of C40_#1 is connected to TDI of C40_#2, and TDO of
C40_#2 is brought out to the TAP. TCK_COMM, TMS_COMM, and TRST_COMM are routed to both C40s in
the module. This configuration allows users to test the module using third-party JTAG testability tools or other
boundary-scan control software. Proper software configuration allows users to debug or launch code on the
module by way of the C40 emulator and extended development system (XDS
) pod. Both of these tools are
used as part of outgoing module testing.
The 42 supports third-party JTAG diagnostic families of products for verification and debug of boundary-scan
circuits, boards, and systems. Further information on JTAG testability tools is available through any TI sales
representative or authorized TI distributor.
XDS is a trademark of Texas Instruments Incorporated.
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相关代理商/技术参数 |
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| SM320VC33 | 制造商:TI 制造商全称:Texas Instruments 功能描述:DIGITAL SIGNAL PROCESSOR |
| SM320VC33-EP | 制造商:TI 制造商全称:Texas Instruments 功能描述:DIGITAL SIGNAL PROCESSOR |
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| SM320VC33GNMM150EP | 功能描述:数字信号处理器和控制器 - DSP, DSC EP Digital Signal Proc RoHS:否 制造商:Microchip Technology 核心:dsPIC 数据总线宽度:16 bit 程序存储器大小:16 KB 数据 RAM 大小:2 KB 最大时钟频率:40 MHz 可编程输入/输出端数量:35 定时器数量:3 设备每秒兆指令数:50 MIPs 工作电源电压:3.3 V 最大工作温度:+ 85 C 封装 / 箱体:TQFP-44 安装风格:SMD/SMT |
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