参数资料
型号: SN54LVTH16952WD
厂商: Texas Instruments, Inc.
元件分类: 通用总线功能
英文描述: Octal 3-State Inverting Buffer/Line Driver/Line Receiver; Package: SOIC-20 WB; No of Pins: 20; Container: Tape and Reel; Qty per Container: 1000
中文描述: 的3.3V ABT生根粉16位收发登记,3态输出
文件页数: 12/13页
文件大小: 211K
代理商: SN54LVTH16952WD
MECHANICAL DATA
MTSS003D – JANUARY 1995 – REVISED JANUARY 1998
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
DGG (R-PDSO-G**)
PLASTIC SMALL-OUTLINE PACKAGE
4040078/F 12/97
48 PINS SHOWN
0,25
0,15 NOM
Gage Plane
6,00
6,20
8,30
7,90
0,75
0,50
Seating Plane
25
0,27
0,17
24
A
48
1
1,20 MAX
M
0,08
0,10
0,50
0
°
–8
°
56
14,10
13,90
48
DIM
A MAX
A MIN
PINS **
12,40
12,60
64
17,10
16,90
0,15
0,05
NOTES: A. All linear dimensions are in millimeters.
B. This drawing is subject to change without notice.
C. Body dimensions do not include mold protrusion not to exceed 0,15.
D. Falls within JEDEC MO-153
相关PDF资料
PDF描述
SN74LVTH16952DGG Ceramic Chip Capacitors / MIL-PRF-55681; Capacitance [nom]: 0.018uF; Working Voltage (Vdc)[max]: 50V; Capacitance Tolerance: +/-10%; Dielectric: Multilayer Ceramic; Temperature Coefficient: X7R (BX); Lead Style: Surface Mount Chip; Lead Dimensions: 1206; Termination: 100% Tin (Sn); Body Dimensions: 0.125" x 0.062" x 0.051"; Container: Bag; Features: MIL-PRF-55681: S Failure Rate
SN54LVTH182245 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3V ABT 扫描检测装置带18位总线收发器)
SN54LVTH18245 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3V ABT 扫描检测装置带18位总线收发器)
SN74LVTH182245 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3V ABT 扫描检测装置带18位总线收发器)
SN74LVTH18245 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3V ABT 扫描检测装置带18位总线收发器)
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