参数资料
型号: SN54LVTH16952WD
厂商: Texas Instruments, Inc.
元件分类: 通用总线功能
英文描述: Octal 3-State Inverting Buffer/Line Driver/Line Receiver; Package: SOIC-20 WB; No of Pins: 20; Container: Tape and Reel; Qty per Container: 1000
中文描述: 的3.3V ABT生根粉16位收发登记,3态输出
文件页数: 2/13页
文件大小: 211K
代理商: SN54LVTH16952WD
SN54LVTH16952, SN74LVTH16952
3.3-V ABT 16-BIT REGISTERED TRANSCEIVERS
WITH 3-STATE OUTPUTS
SCBS697G – JULY 1997 – REVISED APRIL 2000
2
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
description (continued)
These devices are fully specified for hot-insertion applications using I
off
and power-up 3-state. The I
off
circuitry
disables the outputs, preventing damaging current backflow through the devices when they are powered down.
The power-up 3-state circuitry places the outputs in the high-impedance state during power up and power down,
which prevents driver conflict.
The SN54LVTH16952 is characterized for operation over the full military temperature range of –55
°
C to 125
°
C.
The SN74LVTH16952 is characterized for operation from –40
°
C to 85
°
C.
FUNCTION TABLE
INPUTS
OUTPUT
B
CLKENAB
H
CLKAB
X
OEAB
L
A
X
B0
B0
L
X
L
X
L
X
L
L
L
L
L
H
H
X
H
X
Z
A-to-B data flow is shown; B-to-A data flow is similar, but
uses CLKENBA, CLKBA, and OEBA.
Level of B before the indicated steady-state input
conditions were established
相关PDF资料
PDF描述
SN74LVTH16952DGG Ceramic Chip Capacitors / MIL-PRF-55681; Capacitance [nom]: 0.018uF; Working Voltage (Vdc)[max]: 50V; Capacitance Tolerance: +/-10%; Dielectric: Multilayer Ceramic; Temperature Coefficient: X7R (BX); Lead Style: Surface Mount Chip; Lead Dimensions: 1206; Termination: 100% Tin (Sn); Body Dimensions: 0.125" x 0.062" x 0.051"; Container: Bag; Features: MIL-PRF-55681: S Failure Rate
SN54LVTH182245 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3V ABT 扫描检测装置带18位总线收发器)
SN54LVTH18245 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3V ABT 扫描检测装置带18位总线收发器)
SN74LVTH182245 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3V ABT 扫描检测装置带18位总线收发器)
SN74LVTH18245 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3V ABT 扫描检测装置带18位总线收发器)
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