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| 型号： | SN54LVTH18504AHV |
| 厂商： | Texas Instruments, Inc. |
| 英文描述： | Octal 3-State Noninverting Buffer/Line Driver/Line Receiver; Package: SOIC-20 WB; No of Pins: 20; Container: Tape and Reel; Qty per Container: 1000 |
| 中文描述： | 的3.3V ABT生根粉扫描测试设备与20位通用总线收发器 |
| 文件页数： | 10/35页 |
| 文件大小： | 544K |
| 代理商： | SN54LVTH18504AHV |
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SN54LVTH18504A, SN54LVTH182504A, SN74LVTH18504A, SN74LVTH182504A
3.3-V ABT SCAN TEST DEVICES
WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS667B – JULY 1996 – REVISED JUNE 1997
10
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
data register description
boundary-scan register
The boundary-scan register (BSR) is 48 bits long. It contains one boundary-scan cell (BSC) for each
normal-function input pin and one BSC for each normal-function I/O pin (one single cell for both input data and
output data). The BSR is used to store test data that is to be applied externally to the device output pins, and/or
to capture data that appears internally at the outputs of the normal on-chip logic and/or externally at the device
input pins.
The source of data to be captured into the BSR during Capture-DR is determined by the current instruction. The
contents of the BSR can change during Run-Test/Idle as determined by the current instruction. At power up or
in Test-Logic-Reset, BSCs 47–46 are reset to logic 1, ensuring that these cells, which control A-port and B-port
outputs, are set to benign values (i.e., if test mode were invoked, the outputs would be at high-impedance state).
Reset values of other BSCs should be considered indeterminate.
The BSR order of scan is from TDI through bits 47–0 to TDO. Table 1 shows the BSR bits and their associated
device pin signals.
Table 1. Boundary-Scan Register Configuration
BSR BIT
NUMBER
DEVICE
SIGNAL
BSR BIT
NUMBER
DEVICE
SIGNAL
BSR BIT
NUMBER
DEVICE
SIGNAL
47
OEAB
39
A20-I/O
19
B20-I/O
46
OEBA
38
A19-I/O
18
B19-I/O
45
CLKAB
37
A18-I/O
17
B18-I/O
44
CLKBA
36
A17-I/O
16
B17-I/O
43
CLKENAB
35
A16-I/O
15
B16-I/O
42
CLKENBA
34
A15-I/O
14
B15-I/O
41
LEAB
33
A14-I/O
13
B14-I/O
40
LEBA
32
A13-I/O
12
B13-I/O
––
––
31
A12-I/O
11
B12-I/O
––
––
30
A11-I/O
10
B11-I/O
––
––
29
A10-I/O
9
B10-I/O
––
––
28
A9-I/O
8
B9-I/O
––
––
27
A8-I/O
7
B8-I/O
––
––
26
A7-I/O
6
B7-I/O
––
––
25
A6-I/O
5
B6-I/O
––
––
24
A5-I/O
4
B5-I/O
––
––
23
A4-I/O
3
B4-I/O
––
––
22
A3-I/O
2
B3-I/O
––
––
21
A2-I/O
1
B2-I/O
––
––
20
A1-I/O
0
B1-I/O
相关PDF资料 |
PDF描述 |
|---|---|
| SN54LVTH182504A | 3.3-V ABT Scan Test Device With 20-Bit Universal Bus Transceivers(3.3VABT扫描测试装置(20位通用总线收发器)) |
| SN54LVTH18504A | 3.3-V ABT Scan Test Device With 20-Bit Universal Bus Transceivers(3.3VABT扫描测试装置(20位通用总线收发器)) |
| SN54LVTH182646AHV | Octal 3-State Noninverting Buffer/Line Driver/Line Receiver; Package: TSSOP 20 LEAD; No of Pins: 20; Container: Rail; Qty per Container: 75 |
| SN54LVTH18646AHV | Octal 3-State Noninverting Buffer/Line Driver/Line Receiver; Package: SOEIAJ-20; No of Pins: 20; Container: Tape and Reel; Qty per Container: 2000 |
| SN54LVTH182652AHV | Octal 3-State Noninverting Buffer/Line Driver/Line Receiver; Package: TSSOP 20 LEAD; No of Pins: 20; Container: Tape and Reel; Qty per Container: 2500 |
相关代理商/技术参数 |
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|---|---|
| SN54S00J | 制造商:Texas Instruments 功能描述:NAND Gate 4-Element 2-IN Bipolar 14-Pin CDIP Tube 制造商:Rochester Electronics LLC 功能描述:- Bulk |
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| SN54S02J | 制造商:Texas Instruments 功能描述: |
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| SN54S04J | 制造商:Texas Instruments 功能描述:Inverter 6-Element Bipolar 14-Pin CDIP Tube 制造商:Rochester Electronics LLC 功能描述:- Bulk 制造商:Texas Instruments 功能描述:INVERTER 6-ELEM BIPOLAR 14CDIP - Rail/Tube 制造商:Texas Instruments 功能描述:HEX INVERTER *NIC* |
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