参数资料
型号: SN54LVTH18504AHV
厂商: Texas Instruments, Inc.
英文描述: Octal 3-State Noninverting Buffer/Line Driver/Line Receiver; Package: SOIC-20 WB; No of Pins: 20; Container: Tape and Reel; Qty per Container: 1000
中文描述: 的3.3V ABT生根粉扫描测试设备与20位通用总线收发器
文件页数: 33/35页
文件大小: 544K
代理商: SN54LVTH18504AHV
SN54LVTH18504A, SN54LVTH182504A, SN74LVTH18504A, SN74LVTH182504A
3.3-V ABT SCAN TEST DEVICES
WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS667B – JULY 1996 – REVISED JUNE 1997
33
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
switching characteristics over recommended operating free-air temperature range (unless
otherwise noted) (normal mode) (see Figure 14)
SN54LVTH182504A
VCC = 3.3 V
±
0.3 V
SN74LVTH182504A
VCC = 3.3 V
±
0.3 V
PARAMETER
FROM
(INPUT)
TO
(OUTPUT)
VCC = 2.7 V
VCC = 2.7 V
UNIT
MIN
MAX
MIN
MAX
MIN
MAX
MIN
MAX
fmax
tPLH
tPHL
tPLH
tPHL
tPLH
tPHL
tPLH
tPHL
tPLH
tPHL
tPLH
tPHL
tPZH
tPZL
tPHZ
tPLZ
CLKAB or CLKBA
100
80
100
80
MHz
A
B
1.5
6.4
6.9
1.5
5.9
6.6
ns
1.5
6.4
6.9
1.5
5.9
6.6
B
A
1.5
5.4
5.8
1.5
5.1
5.6
ns
1.5
5.4
5.8
1.5
5.1
5.6
CLKAB
B
1.5
6.9
7.8
1.5
6.7
7.7
ns
1.5
6.9
7.8
1.5
6.7
7.7
CLKBA
A
1.5
6.9
7.8
1.5
6.4
7.4
ns
1.5
6.9
7.8
1.5
6.4
7.4
LEAB
B
2
8.7
9.5
2
8.2
9.2
ns
2
7.1
7.4
2
6.7
7.1
LEBA
A
2
8.7
9.5
2
8.1
8.8
ns
2
7.1
7.4
2
6.7
7.1
OEAB or OEBA
B or A
2
9.9
11.1
2
9.5
10.6
ns
2
10.2
11
2
9.7
10.5
OEAB or OEBA
B or A
2.5
12
12.7
2.5
11.1
11.8
ns
2.5
11
11.2
2.5
9.8
10
switching characteristics over recommended operating free-air temperature range (unless
otherwise noted) (test mode) (see Figure 14)
SN54LVTH182504A
VCC = 3.3 V
±
0.3 V
SN74LVTH182504A
VCC = 3.3 V
±
0.3 V
PARAMETER
FROM
(INPUT)
TO
(OUTPUT)
VCC = 2.7 V
VCC = 2.7 V
UNIT
MIN
MAX
MIN
MAX
MIN
MAX
MIN
MAX
fmax
tPLH
tPHL
tPLH
tPHL
tPZH
tPZL
tPZH
tPZL
tPHZ
tPLZ
tPHZ
tPLZ
TCK
50
40
50
40
MHz
TCK
A or B
2.5
15
18
2.5
14
17
ns
2.5
15
18
2.5
14
17
TCK
TDO
1
6
7
1
5.5
6.5
ns
1.5
7
8
1.5
6.5
7.5
TCK
A or B
4
18
21
4
17
20
ns
4
18
21
4
17
20
TCK
TDO
1
6
7
1
5.5
6.5
ns
1.5
6
7
1.5
5.5
6.5
TCK
A or B
4
19
21
4
18
20
ns
4
18
19.5
4
17
18.5
TCK
TDO
1.5
7.5
9
1.5
7
8.5
ns
1.5
7.5
8.5
1.5
7
8
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
相关PDF资料
PDF描述
SN54LVTH182504A 3.3-V ABT Scan Test Device With 20-Bit Universal Bus Transceivers(3.3VABT扫描测试装置(20位通用总线收发器))
SN54LVTH18504A 3.3-V ABT Scan Test Device With 20-Bit Universal Bus Transceivers(3.3VABT扫描测试装置(20位通用总线收发器))
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