参数资料
型号: SN54LVTH18514
厂商: Texas Instruments, Inc.
英文描述: 3.3-V ABT Scan Test Device With 20-Bit Universal Bus Transceivers(3.3VABT扫描测试装置(20位通用总线收发器))
中文描述: 的3.3V ABT生根粉扫描测试设备与20位通用总线收发器(3.3VABT扫描测试装置(20位通用总线收发器))
文件页数: 3/34页
文件大小: 734K
代理商: SN54LVTH18514
SN54LVTH18514, SN54LVTH182514, SN74LVTH18514, SN74LVTH182514
3.3-V ABT SCAN TEST DEVICES
WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS670A – AUGUST 1996 – REVISED JUNE 1997
3
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
functional block diagram
A1
1D
C1
1D
C1
1D
C1
1D
C1
Boundary-Control
Register
Bypass Register
Identification
Register
Boundary-Scan Register
Instruction
Register
TAP
Controller
CLKENAB
LEAB
OEAB
CLKENBA
LEBA
OEBA
TDI
TMS
TCK
B1
TDO
VCC
34
VCC
32
1 of 20 Channels
CLKAB
CLKBA
62
31
29
35
30
36
63
1
64
2
3
33
VCC
VCC
P
相关PDF资料
PDF描述
SN54LVTH182514 3.3-V ABT Scan Test Device With 20-Bit Universal Bus Transceivers(3.3VABT扫描测试装置(20位通用总线收发器))
SN74LVTH182514 3.3-V ABT Scan Test Device With 20-Bit Universal Bus Transceivers(3.3V ABT扫描测试装置(20位通用总线收发器))
SN54LVTH18516 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3VABT扫描测试装置(18位通用总线收发器))
SN74LVTH18516 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3VABT扫描测试装置(18位通用总线收发器))
SN54LVTH182516 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3VABT扫描测试装置(18位通用总线收发器))
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