- 您现在的位置：买卖IC网 > PDF目录373461 > SN54LVTH182514 (Texas Instruments, Inc.) 3.3-V ABT Scan Test Device With 20-Bit Universal Bus Transceivers(3.3VABT扫描测试装置(20位通用总线收发器)) PDF资料下载
参数资料
| 型号： | SN54LVTH182514 |
| 厂商： | Texas Instruments, Inc. |
| 英文描述： | 3.3-V ABT Scan Test Device With 20-Bit Universal Bus Transceivers(3.3VABT扫描测试装置(20位通用总线收发器)) |
| 中文描述： | 的3.3V ABT生根粉扫描测试设备与20位通用总线收发器（3.3VABT扫描测试装置（20位通用总线收发器）） |
| 文件页数： | 1/34页 |
| 文件大小： | 734K |
| 代理商： | SN54LVTH182514 |
当前第1页第2页第3页第4页第5页第6页第7页第8页第9页第10页第11页第12页第13页第14页第15页第16页第17页第18页第19页第20页第21页第22页第23页第24页第25页第26页第27页第28页第29页第30页第31页第32页第33页第34页
SN54LVTH18514, SN54LVTH182514, SN74LVTH18514, SN74LVTH182514
3.3-V ABT SCAN TEST DEVICES
WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS670A – AUGUST 1996 – REVISED JUNE 1997
1
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
Members of the Texas Instruments
SCOPE
Family of Testability Products
Members of the Texas Instruments
Widebus
Family
State-of-the-Art 3.3-V ABT Design Supports
Mixed-Mode Signal Operation (5-V Input
and Output Voltages With 3.3-V V
CC
)
Support Unregulated Battery Operation
Down to 2.7 V
UBT
(Universal Bus Transceiver)
Combines D-Type Latches and D-Type
Flip-Flops for Operation in Transparent,
Latched, or Clocked Mode
Bus Hold on Data Inputs Eliminates the
Need for External Pullup/Pulldown
Resistors
B-Port Outputs of
’
LVTH182514 Devices
Have Equivalent 25-
Series Resistors, So
No External Resistors Are Required
Compatible With the IEEE Std 1149.1-1990
(JTAG) Test Access Port and
Boundary-Scan Architecture
SCOPE
Instruction Set
– IEEE Std 1149.1-1990 Required
Instructions and Optional CLAMP and
HIGHZ
– Parallel-Signature Analysis at Inputs
– Pseudo-Random Pattern Generation
From Outputs
– Sample Inputs/Toggle Outputs
– Binary Count From Outputs
– Device Identification
– Even-Parity Opcodes
Package Options Include 64-Pin Plastic
Thin Shrink Small-Outline (DGG) and 64-Pin
Ceramic Dual Flat (HKC) Packages Using
0.5-mm Center-to-Center Spacings
description
The ’LVTH18514 and ’LVTH182514 scan test devices with 20-bit universal bus transceivers are members of
the Texas Instruments SCOPE
testability integrated-circuit family. This family of devices supports IEEE
Std 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the
test circuitry is accomplished via the 4-wire test access port (TAP) interface.
Additionally, these devices are designed specifically for low-voltage (3.3-V) V
CC
operation, but with the
capability to provide a TTL interface to a 5-V system environment.
Copyright
1997, Texas Instruments Incorporated
PRODUCT PREVIEW information concerns products in the formative or
design phase of development. Characteristic data and other
specifications are design goals. Texas Instruments reserves the right to
change or discontinue these products without notice.
SCOPE, Widebus, and UBT are trademarks of Texas Instruments Incorporated.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
SN54LVTH18514, SN54LVTH182514 . . . HKC PACKAGE
SN74LVTH18514, SN74LVTH182514 . . . DGG PACKAGE
(TOP VIEW)
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
64
63
62
61
60
59
58
57
56
55
54
53
52
51
50
49
48
47
46
45
44
43
42
41
40
39
38
37
36
35
34
33
LEBA
OEBA
A1
A2
A3
GND
A4
A5
A6
V
CC
A7
A8
A9
GND
A10
A11
A12
A13
GND
A14
A15
A16
V
CC
A17
A18
A19
GND
A20
CLKENAB
CLKAB
TDO
TMS
CLKBA
CLKENBA
B1
B2
B3
GND
B4
B5
B6
V
CC
B7
B8
B9
GND
B10
B11
B12
B13
GND
B14
B15
B16
V
CC
B17
B18
B19
GND
B20
OEAB
LEAB
TDI
TCK
P
相关PDF资料 |
PDF描述 |
|---|---|
| SN74LVTH182514 | 3.3-V ABT Scan Test Device With 20-Bit Universal Bus Transceivers(3.3V ABT扫描测试装置(20位通用总线收发器)) |
| SN54LVTH18516 | 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3VABT扫描测试装置(18位通用总线收发器)) |
| SN74LVTH18516 | 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3VABT扫描测试装置(18位通用总线收发器)) |
| SN54LVTH182516 | 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3VABT扫描测试装置(18位通用总线收发器)) |
| SN74LVTH182516 | 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3V ABT扫描测试装置(18位通用总线收发器)) |
相关代理商/技术参数 |
参数描述 |
|---|---|
| SN54S00J | 制造商:Texas Instruments 功能描述:NAND Gate 4-Element 2-IN Bipolar 14-Pin CDIP Tube 制造商:Rochester Electronics LLC 功能描述:- Bulk |
| SN54S00W | 制造商:Rochester Electronics LLC 功能描述:- Bulk |
| SN54S02J | 制造商:Texas Instruments 功能描述: |
| SN54S03J | 制造商:Rochester Electronics LLC 功能描述:- Bulk 制造商:Texas Instruments 功能描述:2-INPUT NAND GATE (OC) - Rail/Tube |
| SN54S04J | 制造商:Texas Instruments 功能描述:Inverter 6-Element Bipolar 14-Pin CDIP Tube 制造商:Rochester Electronics LLC 功能描述:- Bulk 制造商:Texas Instruments 功能描述:INVERTER 6-ELEM BIPOLAR 14CDIP - Rail/Tube 制造商:Texas Instruments 功能描述:HEX INVERTER *NIC* |
发布紧急采购，3分钟左右您将得到回复。