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参数资料
| 型号： | SN54LVTH182514 |
| 厂商： | Texas Instruments, Inc. |
| 英文描述： | 3.3-V ABT Scan Test Device With 20-Bit Universal Bus Transceivers(3.3VABT扫描测试装置(20位通用总线收发器)) |
| 中文描述： | 的3.3V ABT生根粉扫描测试设备与20位通用总线收发器（3.3VABT扫描测试装置（20位通用总线收发器）） |
| 文件页数： | 31/34页 |
| 文件大小： | 734K |
| 代理商： | SN54LVTH182514 |
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SN54LVTH18514, SN54LVTH182514, SN74LVTH18514, SN74LVTH182514
3.3-V ABT SCAN TEST DEVICES
WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS670A – AUGUST 1996 – REVISED JUNE 1997
31
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
timing requirements over recommended operating free-air temperature range (unless otherwise
noted) (normal mode) (see Figure 14)
SN54LVTH182514
VCC = 3.3 V
±
0.3 V
SN74LVTH182514
VCC = 3.3 V
±
0.3 V
UNIT
VCC = 2.7 V
VCC = 2.7 V
MIN
MAX
MIN
MAX
MIN
MAX
MIN
MAX
fclock
Clock frequency
CLKAB or CLKBA
0
100
MHz
tw
Pulse duration
CLKAB or CLKBA high or low
4.4
ns
LEAB or LEBA high
A before CLKAB
↑
or
B before CLKBA
↑
3
Setup time
2.8
tsu
A before LEAB
↓
or
B before LEBA
↓
CLK high
1.5
ns
CLK low
1.6
CLKEN before CLK
↑
A after CLKAB
↑
or
B after CLKBA
↑
A after LEAB
↓
or B after LEBA
↓
CLKEN after CLK
↑
2.8
th
Hold time
1.4
ns
3.1
0.7
timing requirements over recommended operating free-air temperature range (unless otherwise
noted) (test mode) (see Figure 14)
SN54LVTH182514
VCC = 3.3 V
±
0.3 V
SN74LVTH182514
VCC = 3.3 V
±
0.3 V
UNIT
VCC = 2.7 V
VCC = 2.7 V
MIN
MAX
MIN
MAX
MIN
MAX
MIN
MAX
fclock
tw
Clock frequency
TCK
0
50
MHz
Pulse duration
TCK high or low
9.5
ns
tsu
Setup time
A, B, CLK, CLKEN, LE, or OE
before TCK
↑
TDI before TCK
↑
TMS before TCK
↑
A, B, CLK, CLKEN, LE, or OE
after TCK
↑
TDI after TCK
↑
TMS after TCK
↑
Power up to TCK
↑
VCC power up
6.5
ns
2.5
2.5
th
Hold time
1.5
ns
1.5
1.5
td
tr
Delay time
50
ns
μ
s
Rise time
1
P
相关PDF资料 |
PDF描述 |
|---|---|
| SN74LVTH182514 | 3.3-V ABT Scan Test Device With 20-Bit Universal Bus Transceivers(3.3V ABT扫描测试装置(20位通用总线收发器)) |
| SN54LVTH18516 | 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3VABT扫描测试装置(18位通用总线收发器)) |
| SN74LVTH18516 | 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3VABT扫描测试装置(18位通用总线收发器)) |
| SN54LVTH182516 | 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3VABT扫描测试装置(18位通用总线收发器)) |
| SN74LVTH182516 | 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3V ABT扫描测试装置(18位通用总线收发器)) |
相关代理商/技术参数 |
参数描述 |
|---|---|
| SN54S00J | 制造商:Texas Instruments 功能描述:NAND Gate 4-Element 2-IN Bipolar 14-Pin CDIP Tube 制造商:Rochester Electronics LLC 功能描述:- Bulk |
| SN54S00W | 制造商:Rochester Electronics LLC 功能描述:- Bulk |
| SN54S02J | 制造商:Texas Instruments 功能描述: |
| SN54S03J | 制造商:Rochester Electronics LLC 功能描述:- Bulk 制造商:Texas Instruments 功能描述:2-INPUT NAND GATE (OC) - Rail/Tube |
| SN54S04J | 制造商:Texas Instruments 功能描述:Inverter 6-Element Bipolar 14-Pin CDIP Tube 制造商:Rochester Electronics LLC 功能描述:- Bulk 制造商:Texas Instruments 功能描述:INVERTER 6-ELEM BIPOLAR 14CDIP - Rail/Tube 制造商:Texas Instruments 功能描述:HEX INVERTER *NIC* |
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