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| 型号： | SN54LVTH18514 |
| 厂商： | Texas Instruments, Inc. |
| 英文描述： | 3.3-V ABT Scan Test Device With 20-Bit Universal Bus Transceivers(3.3VABT扫描测试装置(20位通用总线收发器)) |
| 中文描述： | 的3.3V ABT生根粉扫描测试设备与20位通用总线收发器（3.3VABT扫描测试装置（20位通用总线收发器）） |
| 文件页数： | 30/34页 |
| 文件大小： | 734K |
| 代理商： | SN54LVTH18514 |
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SN54LVTH18514, SN54LVTH182514, SN74LVTH18514, SN74LVTH182514
3.3-V ABT SCAN TEST DEVICES
WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS
SCBS670A – AUGUST 1996 – REVISED JUNE 1997
30
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER
TEST CONDITIONS
SN54LVTH182514
MIN
TYP
SN74LVTH182514
MIN
TYP
UNIT
MAX
MAX
VIK
VCC = 2.7 V,
VCC = 2.7 V to 3.6 V,
VCC = 2.7 V,
II = –18 mA
IOH = –100
μ
A
IOH = –3 mA
IOH = –8 mA
IOH = –24 mA
IOH = –32 mA
IOH = –12 mA
IOL = 100
μ
A
IOL = 24 mA
IOL = 16 mA
IOL = 32 mA
IOL = 48 mA
IOL = 64 mA
IOL = 12 mA
–1.2
–1.2
V
VOH
A, B, TDO
VCC–0.2
VCC–0.2
V
A port,
TDO
2.4
2.4
VCC= 3 V
VCC = 3 V
2.4
2.4
2
2
B port
2
2
VOL
VCC= 2 7 V
VCC = 2.7 V
A, B, TDO
0.2
0.2
V
A port,
TDO
0.5
0.5
VCC = 3 V
0.4
0.4
0.5
0.5
0.55
0.55
B port
0.8
0.8
II
VCC = 3.6 V,
VI = VCC or GND
CLK,
CLKEN,
LE, TCK
±
1
±
1
VCC = 0 or 3.6 V,
VI = 5.5 V
10
10
VCC= 3 6 V
VCC = 3.6 V
3 6 V
3 6 V
VI = 5.5 V
VI = VCC
VI = 0
VI = 5.5 V
VI = VCC
VI = 0
VI or VO = 0 to
4.5 V
VI = 0.8 V
VI = 2 V
VO = 3 V
VO = 0.5 V
VO = 0.5 V or 3 V
VO = 0.5 V or 3 V
OE TDI
OE, TDI,
TMS
5
5
1
1
μ
A
–25
–100
–25
–100
A or B
ports
20
20
1
1
–5
–5
Ioff
VCC = 0,
±
100
500
μ
A
II(h ld)§
VCC= 3 V
VCC = 3 V
A or B ports
75
500
75
150
μ
A
II(hold)§
–75
–500
–75
–150
–500
IOZH
IOZL
IOZPU
IOZPD
VCC = 3.6 V,
VCC = 3.6 V,
VCC = 0 to 1.5 V,
VCC = 1.5 V to 0,
TDO
1
1
μ
A
μ
A
μ
A
μ
A
TDO
–1
±
50
±
50
–1
±
50
±
50
TDO
TDO
ICC
VCC
O
3 6 V I
0 V
V
GND
Outputs
high
3
Outputs low
30
mA
I
CC
Outputs
disabled
3
ICC
VCC = 3 V to 3.6 V, One input at VCC – 0.6 V,
Other inputs at VCC or GND
VI = 3 V or 0
VO = 3 V or 0
VO = 3 V or 0
All typical values are at VCC = 3.3 V, TA = 25
°
C.
Unused pins at VCC or GND
§The parameter II(hold) includes the off-state output leakage current.
This is the increase in supply current for each input that is at the specified TTL voltage level rather than VCC or GND.
0.5
0.5
mA
Ci
Cio
Co
4
4
pF
10
10
pF
8
8
pF
P
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| SN54LVTH182514 | 3.3-V ABT Scan Test Device With 20-Bit Universal Bus Transceivers(3.3VABT扫描测试装置(20位通用总线收发器)) |
| SN74LVTH182514 | 3.3-V ABT Scan Test Device With 20-Bit Universal Bus Transceivers(3.3V ABT扫描测试装置(20位通用总线收发器)) |
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| SN74LVTH18516 | 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3VABT扫描测试装置(18位通用总线收发器)) |
| SN54LVTH182516 | 3.3-V ABT Scan Test Device With 18-Bit Universal Bus Transceivers(3.3VABT扫描测试装置(18位通用总线收发器)) |
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