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参数资料
| 型号： | SN74ABT18502PMR |
| 厂商： | TEXAS INSTRUMENTS INC |
| 元件分类： | 总线收发器 |
| 英文描述： | ABT SERIES, DUAL 9-BIT BOUNDARY SCAN REG TRANSCEIVER, TRUE OUTPUT, PQFP64 |
| 封装： | GREEN, PLASTIC, LQFP-64 |
| 文件页数： | 31/32页 |
| 文件大小： | 578K |
| 代理商： | SN74ABT18502PMR |
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SN74ABT18502
SCAN TEST DEVICE
WITH 18-BIT REGISTERED BUS TRANSCEIVER
SCBS753 – FEBRUARY 2002
8
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
register overview
With the exception of the bypass register and device IDR, any test register can be thought of as a serial shift
register with a shadow latch on each bit. The bypass register and device IDR differ in that they contain only a
shift register. During the appropriate capture state (Capture-IR for the IR, Capture-DR for DRs), the shift register
may be parallel loaded from a source specified by the current instruction. During the appropriate shift state
(Shift-IR or Shift-DR), the contents of the shift register are shifted out from TDO while new contents are shifted
in at TDI. During the appropriate update state (Update-IR or Update-DR), the shadow latches are updated from
the shift register.
instruction register (IR)
The IR is eight bits long and is used to tell the device what instruction is to be executed. Information contained
in the instruction includes the mode of operation (either normal mode, in which the device performs its normal
logic function, or test mode, in which the normal logic function is inhibited or altered), the test operation to be
performed, which of the four DRs is to be selected for inclusion in the scan path during DR scans, and the source
of data to be captured into the selected DR during Capture-DR.
Table 4 lists the instructions supported by the SN74ABT18502. The even-parity feature specified for SCOPE
devices is supported in this device. Bit 7 of the instruction opcode is the parity bit. Any instructions that are
defined for SCOPE devices but are not supported by this device default to BYPASS.
During Capture-IR, the IR captures the binary value 10000001. As an instruction is shifted in, this value is shifted
out via TDO and can be inspected as verification that the IR is in the scan path. During Update-IR, the value
that has been shifted into the IR is loaded into shadow latches. At this time, the current instruction is updated
and any specified mode change takes effect. At power up or in the Test-Logic-Reset state, the IR is reset to the
binary value 10000001, which selects the IDCODE instruction. The IR order of scan is shown in Figure 2.
Bit 6
Bit 5
Bit 4
Bit 3
Bit 2
Bit 1
TDO
TDI
Bit 7
Parity
(MSB)
Bit 0
(LSB)
Figure 2. IR Order of Scan
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相关代理商/技术参数 |
参数描述 |
|---|---|
| SN74ABT18502PMRG4 | 功能描述:特定功能逻辑 W/18-Bit Univ Bus Trncvr RoHS:否 制造商:Texas Instruments 产品: 系列:SN74ABTH18502A 工作电源电压:5 V 封装 / 箱体:LQFP-64 封装:Tube |
| SN74ABT18502PN | 制造商:TI 功能描述:74ABT18502 S1A4B |
| SN74ABT18504 | 制造商:TI 制造商全称:Texas Instruments 功能描述:SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS |
| SN74ABT18504PM | 功能描述:特定功能逻辑 Device w/20-Bit Univ Bus Transceiver RoHS:否 制造商:Texas Instruments 产品: 系列:SN74ABTH18502A 工作电源电压:5 V 封装 / 箱体:LQFP-64 封装:Tube |
| SN74ABT18504PMG4 | 功能描述:特定功能逻辑 Device w/20-Bit Univ Bus Transceiver RoHS:否 制造商:Texas Instruments 产品: 系列:SN74ABTH18502A 工作电源电压:5 V 封装 / 箱体:LQFP-64 封装:Tube |
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