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| 型号： | SN74ABT18640DGGR |
| 厂商： | TEXAS INSTRUMENTS INC |
| 元件分类： | 总线收发器 |
| 英文描述： | ABT SERIES, DUAL 9-BIT BOUNDARY SCAN TRANSCEIVER, INVERTED OUTPUT, PDSO56 |
| 封装： | GREEN, PLASTIC, TSSOP-56 |
| 文件页数： | 32/32页 |
| 文件大小： | 638K |
| 代理商： | SN74ABT18640DGGR |
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SN54ABT18640, SN74ABT18640
SCAN TEST DEVICES
WITH 18-BIT INVERTING BUS TRANSCEIVERS
SCBS267C – FEBRUARY 1994 – REVISED JULY 1996
9
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
boundary-scan register (continued)
When external data is to be captured, the BSCs for signals 1OEA, 2OEA, 1OEB, and 2OEB capture logic values
determined by the following positive-logic equations:
1OEA
+ 1OE 1DIR,2OEA + 2OE 2DIR,1OEB + 1OE DIR, and 2OEB + 2OE DIR
When data is to be applied externally, these BSCs control the drive state (active or high impedance) of their
respective outputs.
The BSR order of scan is from TDI through bits 43–0 to TDO. Table 1 shows the BSR bits and their associated
device pin signals.
Table 1. Boundary-Scan Register Configuration
BSR BIT
NUMBER
DEVICE
SIGNAL
BSR BIT
NUMBER
DEVICE
SIGNAL
BSR BIT
NUMBER
DEVICE
SIGNAL
BSR BIT
NUMBER
DEVICE
SIGNAL
BSR BIT
NUMBER
DEVICE
SIGNAL
43
2OEB
35
2A9-I/O
26
1A9-I/O
17
2B9-I/O
8
1B9-I/O
42
1OEB
34
2A8-I/O
25
1A8-I/O
16
2B8-I/O
7
1B8-I/O
41
2OEA
33
2A7-I/O
24
1A7-I/O
15
2B7-I/O
6
1B7-I/O
40
1OEA
32
2A6-I/O
23
1A6-I/O
14
2B6-I/O
5
1B6-I/O
39
2DIR
31
2A5-I/O
22
1A5-I/O
13
2B5-I/O
4
1B5-I/O
38
1DIR
30
2A4-I/O
21
1A4-I/O
12
2B4-I/O
3
1B4-I/O
37
2OE
29
2A3-I/O
20
1A3-I/O
11
2B3-I/O
2
1B3-I/O
36
1OE
28
2A2-I/O
19
1A2-I/O
10
2B2-I/O
1
1B2-I/O
––
27
2A1-I/O
18
1A1-I/O
9
2B1-I/O
0
1B1-I/O
boundary-control register
The boundary-control register (BCR) is three bits long. The BCR is used in the context of the boundary-run test
(RUNT) instruction to implement additional test operations not included in the basic SCOPE
instruction set.
Such operations include PRPG, PSA, and binary count up (COUNT). Table 4 shows the test operations that
are decoded by the BCR.
During Capture-DR, the contents of the BCR are not changed. At power up or in Test-Logic-Reset, the BCR is
reset to the binary value 010, which selects the PSA test operation. The BCR order of scan is shown in Figure 3.
Bit 0
(LSB)
TDO
TDI
Bit 1
Bit 2
(MSB)
Figure 3. Boundary-Control Register Order of Scan
bypass register
The bypass register is a 1-bit scan path that can be selected to shorten the length of the system scan path,
reducing the number of bits per test pattern that must be applied to complete a test operation. During
Capture-DR, the bypass register captures a logic 0. The bypass register order of scan is shown in Figure 4.
Bit 0
TDO
TDI
Figure 4. Bypass Register Order of Scan
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相关代理商/技术参数 |
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| SN74ABT18640DL | 功能描述:特定功能逻辑 Device w/18-Bit Inv Bus Transceiver RoHS:否 制造商:Texas Instruments 产品: 系列:SN74ABTH18502A 工作电源电压:5 V 封装 / 箱体:LQFP-64 封装:Tube |
| SN74ABT18640DLG4 | 功能描述:特定功能逻辑 Device w/18-Bit Inv Bus Transceiver RoHS:否 制造商:Texas Instruments 产品: 系列:SN74ABTH18502A 工作电源电压:5 V 封装 / 箱体:LQFP-64 封装:Tube |
| SN74ABT18640DLR | 功能描述:特定功能逻辑 Device w/18-Bit Inv Bus Transceiver RoHS:否 制造商:Texas Instruments 产品: 系列:SN74ABTH18502A 工作电源电压:5 V 封装 / 箱体:LQFP-64 封装:Tube |
| SN74ABT18640DLRG4 | 功能描述:特定功能逻辑 Device w/18-Bit Inv Bus Transceiver RoHS:否 制造商:Texas Instruments 产品: 系列:SN74ABTH18502A 工作电源电压:5 V 封装 / 箱体:LQFP-64 封装:Tube |
| SN74ABT18646 | 制造商:TI 制造商全称:Texas Instruments 功能描述:WITH 18-BIT TRANSCEIVER AND REGISTER |
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