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| 型号： | SN74LVTH18640 |
| 厂商： | Texas Instruments, Inc. |
| 英文描述： | 3.3-V ABT Scan Test Device With 18-Bit Inverting Bus Transceivers(3.3V ABT 扫描检测装置(18位反相总线收发器)) |
| 中文描述： | 的3.3V ABT生根粉扫描测试设备与18位反相总线收发器（3.3V的ABT生根粉扫描检测装置（18位反相总线收发器）） |
| 文件页数： | 2/34页 |
| 文件大小： | 707K |
| 代理商： | SN74LVTH18640 |
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SN54LVTH18640, SN54LVTH182640, SN74LVTH18640, SN74LVTH182640
3.3-V ABT SCAN TEST DEVICES
WITH 18-BIT INVERTING BUS TRANSCEIVERS
SCBS310C – MARCH 1994 – REVISED DECEMBER 1996
2
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
description (continued)
Data flow is controlled by the direction-control (DIR) and output-enable (OE) inputs. Data transmission is
allowed from the A bus to the B bus or from the B bus to the A bus, depending on the logic level at DIR. The
output-enable (OE) can be used to disable the device so that the buses are effectively isolated.
In the test mode, the normal operation of the SCOPE
bus transceivers is inhibited and the test circuitry is
enabled to observe and control the I/O boundary of the device. When enabled, the test circuitry performs
boundary-scan test operations according to the protocol described in IEEE Standard 1149.1-1990.
Four dedicated test pins observe and control the operation of the test circuitry: test data input (TDI), test data
output (TDO), test mode select (TMS), and test clock (TCK). Additionally, the test circuitry performs other testing
functions such as parallel-signature analysis (PSA) on data inputs and pseudo-random pattern generation
(PRPG) from data outputs. All testing and scan operations are synchronized to the TAP interface.
Active bus-hold circuitry is provided to hold unused or floating data inputs at a valid logic level.
The B-port outputs of ’LVTH182640, which are designed to source or sink up to 12 mA, include 25-
series
resistors to reduce overshoot and undershoot.
The SN74LVTH18640 and SN74LVTH182640 are available in TI’s shrink small-outline (DL) and thin shrink
small-outline (DGG) packages, which provide twice the I/O pin count and functionality of standard small-outline
packages in the same printed-circuit-board area.
The SN54LVTH18640 and SN54LVTH182640 are characterized for operation over the full military temperature
range of –55
°
C to 125
°
C. The SN74LVTH18640 and SN74LVTH182640 are characterized for operation from
–40
°
C to 85
°
C.
FUNCTION TABLE
(normal mode, each 9-bit section)
INPUTS
OE
OPERATION
DIR
L
L
B data to A bus
L
H
A data to B bus
H
X
Isolation
P
相关PDF资料 |
PDF描述 |
|---|---|
| SN54LVTH18646A | 3.3-V ABT Scan Test Device With 18-Bit Transceivers and Registers(3.3V ABT 扫描检测装置(18位收发器和寄存器)) |
| SN54LVTH182646A | 3.3-V ABT Scan Test Device With 18-Bit Transceivers and Registers(3.3V ABT 扫描检测装置(18位收发器和寄存器)) |
| SN54LVTH18652A | 3.3-V ABT Scan Test Device With 18-Bit Transceivers and Registers(3.3V ABT 扫描检测装置(18位收发器和寄存器)) |
| SN54LVTH182652A | 3.3-V ABT Scan Test Device With 18-Bit Transceivers and Registers(3.3V ABT 扫描检测装置(18位收发器和寄存器)) |
| SN54LVTH2245 | Octal 3-State Noninverting Buffer/Line Driver/Line Receiver; Package: 20 LEAD PDIP; No of Pins: 20; Container: Rail; Qty per Container: 18 |
相关代理商/技术参数 |
参数描述 |
|---|---|
| SN74LVTH18646APM | 功能描述:特定功能逻辑 3.3-V ABT w/18-Bit Trnscvr & Register RoHS:否 制造商:Texas Instruments 产品: 系列:SN74ABTH18502A 工作电源电压:5 V 封装 / 箱体:LQFP-64 封装:Tube |
| SN74LVTH18646APMG4 | 功能描述:特定功能逻辑 3.3-V ABT w/18-Bit Trnscvr & Register RoHS:否 制造商:Texas Instruments 产品: 系列:SN74ABTH18502A 工作电源电压:5 V 封装 / 箱体:LQFP-64 封装:Tube |
| SN74LVTH18652APM | 功能描述:特定功能逻辑 3.3-V ABT w/18-Bit Trnscvr & Register RoHS:否 制造商:Texas Instruments 产品: 系列:SN74ABTH18502A 工作电源电压:5 V 封装 / 箱体:LQFP-64 封装:Tube |
| SN74LVTH18652APMG4 | 功能描述:特定功能逻辑 3.3-V ABT w/18-Bit Trnscvr & Register RoHS:否 制造商:Texas Instruments 产品: 系列:SN74ABTH18502A 工作电源电压:5 V 封装 / 箱体:LQFP-64 封装:Tube |
| SN74LVTH2245DBR | 功能描述:总线收发器 Tri-St ABT Octal Bus RoHS:否 制造商:Fairchild Semiconductor 逻辑类型:CMOS 逻辑系列:74VCX 每芯片的通道数量:16 输入电平:CMOS 输出电平:CMOS 输出类型:3-State 高电平输出电流:- 24 mA 低电平输出电流:24 mA 传播延迟时间:6.2 ns 电源电压-最大:2.7 V, 3.6 V 电源电压-最小:1.65 V, 2.3 V 最大工作温度:+ 85 C 封装 / 箱体:TSSOP-48 封装:Reel |
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