参数资料
| 型号： | SP526CF-L |
| 厂商： | Exar Corporation |
| 文件页数： | 14/24页 |
| 文件大小： | 0K |
| 描述： | IC TXRX WAN MULTI-MODE 44LQFP |
| 产品变化通告： | Product Discontinuation 21/Dec/2011 |
| 标准包装： | 160 |
| 类型： | 收发器 |
| 驱动器/接收器数： | 4/4 |
| 规程： | 多协议 |
| 电源电压： | 5V |
| 安装类型： | 表面贴装 |
| 封装/外壳： | 44-LQFP |
| 供应商设备封装： | 44-LQFP（10x10） |
| 包装： | 托盘 |
21
Rev: C Date:2/1/06
SP526 Multi–Mode Serial Transceiver
Copyright 2006 Sipex Corporation
potential to the system and humidity will tend to
change the discharge current. For example, the
rise time of the discharge current varies with the
approach speed.
The Contact Discharge Method applies the ESD
current directly to the EUT. This method was
devised to reduce the unpredictability of the
ESD arc. The discharge current rise time is
constant since the energy is directly transferred
without the air-gap arc. In situations such as
hand held systems, the ESD charge can be directly
discharged to the equipment from a person already
holding the equipment. The current is transferred
on to the keypad or the serial port of the equipment
directly and then travels through the PCB and
finally to the IC.
The circuit models in Figures 35 and 36 represent
the typical ESD testing circuits used for all three
methods. The CS is initially charged with the DC
power supply when the first switch (SW1) is on.
Now that the capacitor is charged, the second
switch (SW2) is on while SW1 switches off. The
voltage stored in the capacitor is then applied
through RS, the current limiting resistor, onto the
device under test (DUT). In ESD tests, the SW2
switch is pulsed so that the device under test
receives a duration of voltage.
For the Human Body Model, the current limiting
resistor (R
S) and the source capacitor (CS) are
1.5k
an 100pF, respectively. For IEC-1000-4-
2, the current limiting resistor (R
S) and the source
capacitor (C
S) are 330 an 150pF, respectively.
The higher C
S value and
lower R
S value in the
IEC1000-4-2 model are more stringent than the
Human Body Model. The larger storage capacitor
injects a higher voltage to the test point when
SW2 is switched on. The lower current limiting
resistor increases the current charge onto the test
point.
NET1/NET2 European Compliancy
As with all of Sipex's previous multi-protocol
serial transceiver ICs, the drivers and receivers
have been designed to meet all the requirements
to NET1/NET2. The SP526 is also tested and
adheres to all the NET1/2 physical layer testing
and the ITU Series V specifications. Please note
that although the SP526, as with its predecessors,
adheres to NET1/2 testing, any complex or
unusual configuration should be double-checked
to ensure NET compliance. Consult the factory
for details.
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