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10.8 I/O PORT PIN CHARACTERISTICS
10.8.1 General Characteristics
Subject to general operating conditions for VDD, fOSC, and TA unless otherwise specified.
Figure 55. Typical RPU vs. VDD with VIN = VSS
Notes:
1. Unless otherwise specified, typical data are based on TA=25°C and VDD=5V.
2. Data based on characterization results, not tested in production.
3. Hysteresis voltage between Schmitt trigger switching levels. Based on characterization results, not tested.
4. The RPU pull-up equivalent resistor is based on a resistive transistor. This data is based on characterization results,
not tested in production.
5. Data based on characterization results, not tested in production.
6. To generate an external interrupt, a minimum pulse width has to be applied on an I/O port pin configured as an external
interrupt source.
Figure 56. Two typical Applications with unused I/O Pin
Symbol
Parameter
Conditions
Min
Typ 1)
Max
Unit
VIL
Input low level voltage 2)
0.3xVDD
V
VIH
Input high level voltage 2)
0.7xVDD
Vhys
Schmitt trigger voltage hysteresis 3)
VDD=5V
200
400
mV
VDD=3.3V
200
400
IL
Input leakage current
VSS≤VIN≤VDD
(no pull-up configured)
0.1
1
μA
RPU
Weak pull-up equivalent resistor 4)
VIN=VSS
VDD=5V
40
110
350
k
Ω
VDD=3.3V
80
230
700
CIN
I/O input pin capacitance
5
10
pF
COUT
I/O output pin capacitance
5
10
pF
tf(IO)out
Output high to low level fall time 5)
CL=50pF
Between 10% and 90%
30
ns
tr(IO)out
Output low to high level rise time 5)
35
tw(IT)in
External interrupt pulse time 6)
1tCPU
34
56
VDD [V]
50
100
150
200
250
300
350
Rpu [Khom]
Ta=-40°C
Ta=25°C
Ta=95°C
Ta=125°C
10k
Ω
UNUSED I/O PORT
ST62XX
10k
Ω
UNUSED I/O PORT
ST62XX
VDD
1