参数资料
型号: STM32F105VCT7TR
厂商: STMICROELECTRONICS
元件分类: 微控制器/微处理器
英文描述: 32-BIT, FLASH, 72 MHz, RISC MICROCONTROLLER, PQFP100
封装: 14 X 14 MM, ROHS COMPLIANT, LQFP-100
文件页数: 30/95页
文件大小: 1007K
代理商: STM32F105VCT7TR
Electrical characteristics
STM32F105xx, STM32F107xx
36/95
Doc ID 15274 Rev 4
5.3.4
Embedded reference voltage
The parameters given in Table 12 are derived from tests performed under ambient
temperature and VDD supply voltage conditions summarized in Table 9.
5.3.5
Supply current characteristics
The current consumption is a function of several parameters and factors such as the
operating voltage, ambient temperature, I/O pin loading, device software configuration,
operating frequencies, I/O pin switching rate, program location in memory and executed
binary code.
The current consumption is measured as described in Figure 8: Current consumption
measurement scheme.
All Run-mode current consumption measurements given in this section are performed with a
reduced code that gives a consumption equivalent to Dhrystone 2.1 code.
Maximum current consumption
The MCU is placed under the following conditions:
G
All I/O pins are in input mode with a static value at VDD or VSS (no load)
G
All peripherals are disabled except when explicitly mentioned
G
The Flash memory access time is adjusted to the fHCLK frequency (0 wait state from 0
to 24 MHz, 1 wait state from 24 to 48 MHz and 2 wait states above)
G
Prefetch in ON (reminder: this bit must be set before clock setting and bus prescaling)
G
When the peripherals are enabled fPCLK1 = fHCLK/2, fPCLK2 = fHCLK
The parameters given in Table 13, Table 14 and Table 15 are derived from tests performed
under ambient temperature and VDD supply voltage conditions summarized in Table 9.
Table 12.
Embedded internal reference voltage
Symbol
Parameter
Conditions
Min
Typ
Max
Unit
VREFINT
Internal reference voltage
–40 °C < TA < +105 °C 1.16
1.20
1.26
V
–40 °C < TA < +85 °C
1.16
1.20
1.24
V
TS_vrefint
(1)
1. Shortest sampling time can be determined in the application by multiple iterations.
ADC sampling time when
reading the internal reference
voltage
5.1
17.1(2)
2. Guaranteed by design, not tested in production.
s
VRERINT
(2)
Internal reference voltage
spread over the temperature
range
VDD = 3 V ±10 mV
10
mV
TCoeff
(2)
Temperature coefficient
100
ppm/°C
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