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参数资料
型号： STM32F205REY6XXX
厂商： STMICROELECTRONICS
元件分类： 微控制器/微处理器
英文描述： 32-BIT, FLASH, 120 MHz, RISC MICROCONTROLLER, PBGA66
封装： 0.40 MM PITCH, ROHS COMPLIANT, WLCSP-66
文件页数： 150/163页
文件大小： 2275K
代理商： STM32F205REY6XXX
STM32F205xx, STM32F207xx
Electrical characteristics
Doc ID 15818 Rev 7
87/163
A device reset allows normal operations to be resumed.
The test results are given in Table 36. They are based on the EMS levels and classes
defined in application note AN1709.
Designing hardened software to avoid noise problems
EMC characterization and optimization are performed at component level with a typical
application environment and simplified MCU software. It should be noted that good EMC
performance is highly dependent on the user application and the software in particular.
Therefore it is recommended that the user applies EMC software optimization and
prequalification tests in relation with the EMC level requested for his application.
Software recommendations
The software flowchart must include the management of runaway conditions such as:
●
Corrupted program counter
●
Unexpected reset
●
Critical Data corruption (control registers...)
Prequalification trials
Most of the common failures (unexpected reset and program counter corruption) can be
reproduced by manually forcing a low state on the NRST pin or the Oscillator pins for 1
second.
To complete these trials, ESD stress can be applied directly on the device, over the range of
specification values. When unexpected behavior is detected, the software can be hardened
to prevent unrecoverable errors occurring (see application note AN1015).
Electromagnetic Interference (EMI)
The electromagnetic field emitted by the device are monitored while a simple application,
executing EEMBC code, is running. This emission test is compliant with SAE IEC61967-2
standard which specifies the test board and the pin loading.
Table 36.
EMS characteristics
Symbol
Parameter
Conditions
Level/
Class
VFESD
Voltage limits to be applied on any I/O pin to
induce a functional disturbance
VDD = 3.3 V, LQFP100, TA = +25 °C,
fHCLK = 75 MHz, conforms to
IEC 61000-4-2
2B
VEFTB
Fast transient voltage burst limits to be
applied through 100 pF on VDD and VSS
pins to induce a functional disturbance
VDD = 3.3 V, LQFP100, TA = +25 °C,
fHCLK = 75 MHz, conforms to
IEC 61000-4-2
4A
相关PDF资料
PDF描述
STM32F205RFT6TR 32-BIT, FLASH, 120 MHz, RISC MICROCONTROLLER, PQFP64
STM32F205RFT7XXX 32-BIT, FLASH, 120 MHz, RISC MICROCONTROLLER, PQFP64
STM32F205RFY6TR 32-BIT, FLASH, 120 MHz, RISC MICROCONTROLLER, PBGA66
STM32F205RGT7TR 32-BIT, FLASH, 120 MHz, RISC MICROCONTROLLER, PQFP64
STM32F205RGY7TR 32-BIT, FLASH, 120 MHz, RISC MICROCONTROLLER, PBGA66
相关代理商/技术参数
参数描述
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