收藏本站
参数资料
型号： STM8AF6126TBX
厂商： STMICROELECTRONICS
元件分类： 微控制器/微处理器
英文描述： 8-BIT, FLASH, 16 MHz, MICROCONTROLLER, PQFP32
封装： 7 X 7 MM, ROHS COMPLIANT, LQFP-32
文件页数： 76/99页
文件大小： 881K
代理商： STM8AF6126TBX
Electrical characteristics
STM8AF61xx, STM8AF62xx
78/99
Doc ID 14952 Rev 4
10.3.12
EMC characteristics
Susceptibility tests are performed on a sample basis during product characterization.
Functional EMS (electromagnetic susceptibility)
While executing a simple application (toggling 2 LEDs through I/O ports), the product is
stressed by two electromagnetic events until a failure occurs (indicated by the LEDs).
●
ESD
: Electrostatic discharge (positive and negative) is applied on all pins of the device
until a functional disturbance occurs. This test conforms with the IEC 1000-4-2
standard.
●
FTB
: A burst of fast transient voltage (positive and negative) is applied to VDD and VSS
through a 100 pF capacitor, until a functional disturbance occurs. This test conforms
with the IEC 1000-4-4 standard.
A device reset allows normal operations to be resumed. The test results are given in the
table below based on the EMS levels and classes defined in application note AN1709.
Designing hardened software to avoid noise problems
EMC characterization and optimization are performed at component level with a typical
application environment and simplified MCU software. It should be noted that good EMC
performance is highly dependent on the user application and the software in particular.
Therefore it is recommended that the user applies EMC software optimization and
prequalification tests in relation with the EMC level requested for his application.
Software recommendations
The software flowchart must include the management of runaway conditions such as:
●
Corrupted program counter
●
Unexpected reset
●
Critical data corruption (control registers...)
Prequalification trials
Most of the common failures (unexpected reset and program counter corruption) can be
recovered by applying a low state on the NRST pin or the oscillator pins for 1 second.
To complete these trials, ESD stress can be applied directly on the device, over the range of
specification values. When unexpected behavior is detected, the software can be hardened
to prevent unrecoverable errors occurring (see application note AN1015).
Table 58.
EMS data
Symbol
Parameter
Conditions
Level/class
VFESD
Voltage limits to be applied on any I/O pin to
induce a functional disturbance
VDD = 3.3 V, TA= 25 °C,
fMASTER = 16 MHz (HSI clock),
Conforms to IEC 1000-4-2
3B
VEFTB
Fast transient voltage burst limits to be
applied through 100 pF on VDD and VSS
pins to induce a functional disturbance
VDD= 3.3 V, TA= 25 °C,
fMASTER = 16 MHz (HSI clock),
Conforms to IEC 1000-4-4
4A
相关PDF资料
PDF描述
STM8AF6126TCX 8-BIT, FLASH, 16 MHz, MICROCONTROLLER, PQFP32
STM8AF6266TDY 8-BIT, FLASH, 16 MHz, RISC MICROCONTROLLER, PQFP32
STM8AF6146TAU 8-BIT, FLASH, 16 MHz, MICROCONTROLLER, PQFP32
STM8AF6168TBX 8-BIT, FLASH, 16 MHz, MICROCONTROLLER, PQFP48
STM8AF6226TAU 8-BIT, FLASH, 16 MHz, RISC MICROCONTROLLER, PQFP32
相关代理商/技术参数
参数描述
STM8AF6146 制造商:STMICROELECTRONICS 制造商全称:STMicroelectronics 功能描述:Automotive 8-bit MCU, with up to 32 Kbytes Flash, data EEPROM, 10-bit ADC, timers, LIN, SPI, I2C, 3 to 5.5 V
STM8AF6146TCY 制造商:STMicroelectronics 功能描述:
STM8AF6148 制造商:STMICROELECTRONICS 制造商全称:STMicroelectronics 功能描述:Automotive 8-bit MCU, with up to 32 Kbytes Flash, data EEPROM, 10-bit ADC, timers, LIN, SPI, I2C, 3 to 5.5 V
STM8AF6166 制造商:STMICROELECTRONICS 制造商全称:STMicroelectronics 功能描述:Automotive 8-bit MCU, with up to 32 Kbytes Flash, data EEPROM, 10-bit ADC, timers, LIN, SPI, I2C, 3 to 5.5 V
STM8AF6166TAY 制造商:STMicroelectronics 功能描述:AUTOMOTIVE 8-BIT MCU, WITH UP TO 32 KBYTES FLASH, EEPROM - Trays
发布紧急采购，3分钟左右您将得到回复。

采购需求

(若只采购一条型号，填写一行即可)

发布成功！您可以继续发布采购。也可以进入我的后台，查看报价

发布成功！您可以继续发布采购。也可以进入我的后台，查看报价

*型号 *数量 厂商 批号 封装
添加更多采购

我的联系方式

*
*
*