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参数资料
| 型号： | STR710RZT6 |
| 厂商： | STMICROELECTRONICS |
| 元件分类： | 微控制器/微处理器 |
| 英文描述： | 32-BIT, FLASH, 66 MHz, RISC MICROCONTROLLER, PQFP144 |
| 封装： | 20 X 20 MM, 0.50 MM PITCH, LQFP-144 |
| 文件页数： | 43/77页 |
| 文件大小： | 1919K |
| 代理商： | STR710RZT6 |
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Electrical parameters
STR71xF
48/77
Electro Magnetic Interference (EMI)
Based on a simple application running on the product (toggling 2 LEDs through the I/O
ports), the product is monitored in terms of emission. This emission test is in line with the
norm SAE J 1752/3 which specifies the board and the loading of each pin.
Notes:
1. Not tested in production.
2. BGA and LQFP devices have similar EMI characteristics.
Absolute Maximum Ratings (Electrical Sensitivity)
Based on three different tests (ESD, LU and DLU) using specific measurement methods, the
product is stressed in order to determine its performance in terms of electrical sensitivity.
For more details, refer to the application note AN1181.
Electro-Static Discharge (ESD)
Electro-Static Discharges (a positive then a negative pulse separated by 1 second) are
applied to the pins of each sample according to each pin combination. The sample size
depends on the number of supply pins in the device (3 parts*(n+1) supply pin). Two models
can be simulated: Human Body Model and Machine Model. This test conforms to the
JESD22-A114A/A115A standard.
Table 24.
EMS data
Symbol
Parameter
Conditions
Level/
Class
VFESD
Voltage limits to be applied on any I/O pin to
induce a functional disturbance
V33=3.3V, TA=+25°C, fMCLK=32MHz
conforms to IEC 1000-4-2
2B
VEFTB
Fast transient voltage burst limits to be
applied through 100pF on VDD and VSS pins
to induce a functional disturbance
V33=3.3V, TA=+25°C, fMCLK=32MHz
conforms to IEC 1000-4-4
4A
Table 25.
EMI data
Symbol
Parameter
Conditions
Monitored
Frequency Band
Max vs.
[fOSC4M/fHCLK]
Unit
16/
48MHz
16/8MHz
SEMI
Peak level
V33=3.3V, TA=+25°C,
LQFP64 package
conforming to SAE J
1752/3
0.1MHz to 30 MHz
17
19
dB
V
30 MHz to 130 MHz
17
16
130 MHz to 1GHz
11
SAE EMI Level
4
3
-
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