参数资料
型号: STR710RZT6
厂商: STMICROELECTRONICS
元件分类: 微控制器/微处理器
英文描述: 32-BIT, FLASH, 66 MHz, RISC MICROCONTROLLER, PQFP144
封装: 20 X 20 MM, 0.50 MM PITCH, LQFP-144
文件页数: 44/77页
文件大小: 1919K
代理商: STR710RZT6
STR71xF
Electrical parameters
49/77
Notes:
1.
Data based on characterization results, not tested in production.
Static and Dynamic Latch-Up
LU: 3 complementary static tests are required on 10 parts to assess the latch-up
performance. A supply overvoltage (applied to each power supply pin) and a current
injection (applied to each input, output and configurable I/O pin) are performed on each
sample. This test conforms to the EIA/JESD 78 IC latch-up standard. For more details,
refer to the application note AN1181.
DLU: Electro-Static Discharges (one positive then one negative test) are applied to
each pin of 3 samples when the micro is running to assess the latch-up performance in
dynamic mode. Power supplies are set to the typical values, the oscillator is connected
as near as possible to the pins of the micro and the component is put in reset mode.
This test conforms to the IEC1000-4-2 and SAEJ1752/3 standards. For more details,
refer to the application note AN1181.
Electrical Sensitivities
Notes:
1.
Class description: A Class is an STMicroelectronics internal specification. All its limits are higher than the
JEDEC specifications, that means when a device belongs to Class A it exceeds the JEDEC standard. B
Class strictly covers all the JEDEC criteria (international standard).
Table 26.
ESD Absolute Maximum ratings
Symbol
Ratings
Conditions
Maximum
value 1)
Unit
VESD(HBM)
Electro-static discharge voltage
(Human Body Model)
TA=+25°C
2000
V
VESD(MM)
Electro-static discharge voltage
(Machine Model)
200
VESD(CDM)
Electro-static discharge voltage
(Charge Device Model)
750 on corner
pins, 500 on
others
Symbol
Parameter
Conditions
Class 1)
LU
Static latch-up class
TA=+25°C
TA=+85°C
TA=+105°C
A
DLU
Dynamic latch-up class
VDD=3.3V, fOSC4M=4MHz, fMCLK=32MHz,
TA=+25°C
A
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