参数资料
型号: STR911FAZ34H6T
厂商: STMICROELECTRONICS
元件分类: 微控制器/微处理器
英文描述: 32-BIT, FLASH, 96 MHz, RISC MICROCONTROLLER, BGA144
封装: LFBGA-144
文件页数: 89/100页
文件大小: 1801K
代理商: STR911FAZ34H6T
STR91xFAxxx
Electrical characteristics
Table 48.
ADC conversion time (silicon Rev G)
Symbol
Parameter(1) (2)
Test
conditions
Value
Unit
Min
Typ
Max
tCONV(S] Single mode conversion time
2*16/fADC
3*16/fADC
s
fADC = 24 MHz
1.33
2
TR(S)
Single mode throughput rate (3)
fADC = 24 MHz
500
ksps
tCONV(C] Continuous mode conversion time
(4)
1*16/fADC
s
fADC = 24 MHz
0.66
s
TR(C)
Continuous mode throughput rate
fADC = 24 MHz
1500
ksps
1.
Guaranteed by design, not tested in production.
2.
Parameters in this table apply to devices with silicon Rev G. Refer to Table 5 for device rev identification in OTP memory
3.
Value obtained on conversions started by trigger in single mode
4.
All sucessive conversions in continuous and scan modes.
Table 49.
ADC conversion time (silicon Rev H and higher)
Symbol
Parameter(1) (2)
Test
conditions
Value
Unit
Min
Typ
Max
tCONV(S] Single mode conversion time
1*16/fADC
2*16/fADC
s
fADC = 24 MHz
0.66
1.33
TR(S)
Single mode throughput rate (3)
fADC = 24 MHz
750
ksps
tCONV(C] Continuous mode conversion time
(4)
1*16/fADC
s
fADC = 24 MHz
0.66
s
TR(C)
Continuous mode throughput rate
fADC = 24 MHz
1500
ksps
tCONV(FT] Fast trigger mode conversion time
(5)
1*16/fADC
s
fADC = 24 MHz
0.66
s
TR(FT)
Fast trigger mode throughput rate(6)
fADC = 24 MHz
100
1200
ksps
1.
Guaranteed by design, not tested in production.
2.
Parameters in this table apply to devices with silicon Rev H and higher. Refer to Table 5 for device rev identification in OTP
3.
Value obtained from conversions started by trigger in single mode
4.
All successive conversions in continuous and scan modes.
5.
Conversion started by trigger when automatic clock gated mode enabled. Fast trigger mode is available only in devices with
silicon Rev H and higher.
6.
Value obtained from conversions started by fast trigger in single mode
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