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参数资料
| 型号： | TAS5186DDVR |
| 厂商： | TEXAS INSTRUMENTS INC |
| 元件分类： | 音频／视频放大 |
| 英文描述： | 60 W, 6 CHANNEL, AUDIO AMPLIFIER, PDSO44 |
| 封装： | GREEN, PLASTIC, HTSSOP-44 |
| 文件页数： | 11/16页 |
| 文件大小： | 342K |
| 代理商： | TAS5186DDVR |
www.ti.com
PACKAGE HEAT DISSIPATION RATINGS
(1)
ABSOLUTE MAXIMUM RATINGS
TAS5186
SLES136 – MAY 2005
Table 1. MODE Selection Pins
MODE PINS(1)
MODE
M2
M3
NAME
DESCRIPTION
0
2.1 mode
Channels A, B, and C enabled; channels D, E, and F disabled
0
1
5.1 mode
All channels enabled
1
0/1
Reserved
(1)
M1 must always be connected to ground. 0 indicates a pin connected to GND; 1 indicates a pin connected to VREG.
PARAMETER
TAS5186DDV
RθJC (°C/W)—1 satellite (sat.) FET only
10.3
RθJC (°C/W)—1 subwoofer (sub.) FET only
5.2
RθJC (°C/W)—1 sat. half-bridge
5.2
RθJC (°C/W)—1 sub. half-bridge
2.6
RθJC (°C/W)—5 sat. half-bridges + 1 sub.
1.74
Typical pad area(2)
34.9 mm2
(1)
JC is junction-to-case, CH is case-to-heatsink.
(2)
RθCH is an important consideration. Assume a 2-mil thickness of typical thermal grease between the pad area and the heatsink. The
RθCH with this condition is typically 2°C/W for this package.
over operating free-air temperature range (unless otherwise noted)(1)
TAS5186
VDD to AGND
–0.3 V to 13.2 V
GVDD_X to AGND
–0.3 V to 13.2 V
PVDD_X to PGND_X (2)
–0.3 V to 50 V
OUT_X to PGND_X (2)
–0.3 V to 50 V
BST_X to PGND_X (2)
–0.3 V to 63.2 V
VREG to AGND
–0.3 V to 4.2 V
PGND_X to GND
–0.3 V to 0.3 V
PGND_X to AGND
–0.3 V to 0.3 V
GND to AGND
–0.3 V to 0.3 V
PWM_X, OC_ADJ, M1, M2, M3 to AGND
–0.3 V to 4.2 V
RESET, SD, OTW to AGND
–0.3 V to 7 V
Maximum operating junction temperature range (TJ )
0 to 125°C
Storage temperature
–40°C to 125°C
Lead temperature – 1,6 mm (1/16 inch) from case for 10 seconds
260°C
Minimum PWM pulse duration, low
30 ns
(1)
Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2)
These voltages represent the dc voltage + peak ac waveform measured at the terminal of the device in all conditions.
4
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