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参数资料
| 型号： | TDA1310AT-T |
| 厂商： | NXP SEMICONDUCTORS |
| 元件分类： | DAC |
| 英文描述： | SERIAL INPUT LOADING, 0.2 us SETTLING TIME, 16-BIT DAC, PDSO8 |
| 封装： | PLASTIC, SOT-96AG, SO-8 |
| 文件页数： | 14/16页 |
| 文件大小： | 114K |
| 代理商： | TDA1310AT-T |
May 1994
7
Philips Semiconductors
Preliminary specication
Stereo Continuous Calibration DAC
(CC-DAC)
TDA1310A
CHARACTERISTICS
VDD =5V; Tamb =25 °C; measured in Fig.1; unless otherwise specied.
SYMBOL
PARAMETER
CONDITIONS
MIN.
TYP.
MAX.
UNIT
Supply
VDD
supply voltage
3.0
5.0
5.5
V
IDD
supply current
at code 0000H
3.0
4.0
mA
SVRR
supply voltage ripple rejection
note 1
30
dB
Digital inputs; pins WS, BCK and DATA
|I
IL|
input leakage current LOW
VI =0V
10
A
|IIH|
input leakage current HIGH
VI =5V
10
A
fclk
clock frequency
18.4
MHz
BR
bit rate data input
18.4
Mbits/s
fWS
word select input frequency
384
kHz
Timing (see Fig.4)
tr
rise time
12
ns
tf
fall time
12
ns
tCY
bit clock cycle time
54
ns
tBCKH
bit clock pulse width HIGH
15
ns
tBCKL
bit clock pulse width LOW
15
ns
tSU;DAT
data set-up time
12
ns
tHD:DAT
data hold time to bit clock
2
ns
tHD:WS
word select hold time
2
ns
tSU;WS
word select set-up time
12
ns
Analog input; pin Iref
Rref
reference resistor
see Fig.1
7.4
11.0
14.6
k
Analog outputs; pins IOL and IOR
RES
resolution
16
bits
VDCC
DC output voltage compliance
2.0
VDD 1V
IFS
full-scale current
0.9
1.0
1.1
mA
TCFS
full-scale temperature
coefcient
±400 × 106
Ibias
bias current
643
714
785
A
GFS
reference input current to full
scale output current gain
11.9
13.2
14.5
Gbias
reference input current to bias
current gain
8.48
9.42
10.36
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