参数资料
型号: TDF8554J/N4
厂商: NXP SEMICONDUCTORS
元件分类: 音频/视频放大
英文描述: 44 W, 4 CHANNEL, AUDIO AMPLIFIER, PZFM37
封装: PLASTIC, SOT725-1, 37 PIN
文件页数: 4/56页
文件大小: 597K
代理商: TDF8554J/N4
TDF8554J
All information provided in this document is subject to legal disclaimers.
NXP B.V. 2011. All rights reserved.
Product data sheet
Rev. 1 — 31 August 2011
12 of 56
NXP Semiconductors
TDF8554J
4
45 W power amplifier with multiple voltage regulator
7.4.3 Speaker fault detection
There are two protection features available to prevent damage to the speaker if one side
of the speaker is connected to ground.
A check for a speaker fault operates during start-up. This is included in the check for a
short to ground; the channel that has the speaker fault is switched off. If the short to
ground bit is set, it can mean either a short to ground or a speaker fault. At start-up it
is difficult to distinguish between a speaker fault and a short to ground. The amplifier
is protected against both, but the speaker fault bit is not always set.
A check for a speaker fault operates continuously. If a speaker fault is detected and
IB5[D3] = 1, bit D3 in registers DB1 to DB4 are set but the amplifier is not switched off
and pin DIAG is not pulled LOW.
7.4.4 Overvoltage warning and load dump protection
If the battery voltage VP exceeds the maximum value of Vth(ovp), the device switches off
the output stages of the amplifier to protect the output transistors. The overvoltage
pre-warning bit is set when the supply voltage level exceeds the value of VP(ovp)pwarn.
Although the amplifier switches off the output stages, the device remains operational
during load dump conditions (maximum value of VP at load dump protection; duration
50 ms, rise time > 2.5 ms). The occurrence of the load dump situation can last for a longer
time without damaging the device. Provided that the I2C-bus supply is within the levels
specified, communication with the I2C-bus bus during load dump situations remains
possible and the status of the channel outputs can be read.
(1) Amplifier output stage.
Fig 6.
Test circuit for loss-of-VP test
Cbuffer
116 mF
VP
RS
2200 μF
PMOS
IRF5305
Vpulse
5
7
9
17
19
21
23
3
001aao146
Loss-of-VP tester
DUT in application
(1)
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