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参数资料
| 型号： | TPS84410RKGT |
| 厂商： | TEXAS INSTRUMENTS INC |
| 元件分类： | 稳压器 |
| 英文描述： | 4 A SWITCHING REGULATOR, 600 kHz SWITCHING FREQ-MAX, PQCC39 |
| 封装： | 9 X 11 MM, 2.80 MM HEIGHT, GREEN, PLASTIC, BQFN-39 |
| 文件页数： | 12/26页 |
| 文件大小： | 819K |
| 代理商： | TPS84410RKGT |
SLVSAR5
– SEPTEMBER 2011
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
ORDERING INFORMATION(1)
ORDERABLE
TRANSPORT
MINIMUM
TA
PACKAGE
PINS
ECO PLAN
NUMBER
MEDIA
QUANTITY
500
Green (RoHS and
TPS84410RKGR
Tape and Reel
no Sb/Br)
Plastic Quad Flat
-40
°C to 85°C
39
Pack (BQFN)
250
Green (RoHS and
TPS84410RKGT
Tape and Reel
no Sb/Br)
(1)
For the most current package and ordering information, see the Package Option Addendum at the end of this datasheet, or see the TI
website at www.ti.com.
ABSOLUTE MAXIMUM RATINGS
(1) over operating temperature range (unless otherwise noted)
VALUE
UNIT
MIN
MAX
VIN, PWRGD
–0.3
7
V
INH/UVLO, RT/CLK
–0.3
3.3
V
Input Voltage
SS/TR, STSEL, VADJ
–0.3
3
V
SENSE+
VADJ rating must also be met
-0.3
VOUT
V
PH
–0.6
7
V
Output Voltage
PH 10ns Transient
–2
7
V
VOUT
-0.6
VIN
V
VDIFF (GND to exposed thermal pad)
–0.2
0.2
V
RT/CLK, INH/UVLO
±100
A
Source Current
PH
Current Limit
A
PH
Current Limit
A
Sink Current
SS/TR
±100
A
PWRGD
10
mA
Operating Junction Temperature
–40
125(2)
°C
Storage Temperature
–65
150
°C
Mechanical Shock
Mil-STD-883D, Method 2002.3, 1 msec, 1/2 sine, mounted
1500
G
Mechanical Vibration
Mil-STD-883D, Method 2007.2, 20-2000Hz
20
(1)
Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating
conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2)
See the temperature derating curves in the Typical Characteristics section for thermal information.
2
Copyright
2011, Texas Instruments Incorporated
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