参数资料
型号: WJLXT905LE.C2
厂商: CORTINA SYSTEMS INC
元件分类: 网络接口
英文描述: DATACOM, ETHERNET TRANSCEIVER, PQFP32
封装: ROHS COMPLIANT, MO-136BC, LQFP-32
文件页数: 17/40页
文件大小: 544K
代理商: WJLXT905LE.C2
LXT905 Universal 10BASE-T Transceiver with 3.3V Support
24
Datasheet
Document Number: 249271
Revision Number: 004
Revision Date: 19-Oct-2005
Output fall
time
TCLK & RCLK
CMOS
3
15
ns
CLOAD= 20 pF
TTL
2
15
ns
CLKI rise time (externally driven)
10
ns
CLKI duty cycle (externally
driven)
50/50
40/60
%
Supply current
Normal Mode
ICC
40
80
mA
Idle Mode
ICC
70
100
mA
Transmitting on TP
Power Down
Mode
ICC
–0.01
1
A
Table 8.
TP Electrical Characteristics
Parameter
Symbol
Min
Typ
1
Max
Units
Test Conditions
Transmit output impedance
ZOUT
–5
Ω
Transmit timing jitter addition
2
±6.4
±10
ns
0 line length for internal
MAU
Transmit timing jitter that the
MAU and PLS sections add2, 3
±3.5
±5.5
ns
After line model
specified in IEEE 802.3
for 10BASE-T internal
MAU
Receive input impedance
ZIN
–24
k
Ω
Between TPIP/TPIN
Differential squelch threshold
VDS
300
420
585
mV
5 MHz square wave
input
1. Typical values are at 25 °C, are for design aid only, are not guaranteed, and are not subject to production
testing.
2. Parameter is guaranteed by design; not subject to production testing.
3. IEEE 802.3 specifies maximum jitter additions at 0.5 ns from the encoder, and 3.5 ns from the MAU.
Table 9.
Switching Characteristics
Parameter
Symbol
Minimum
Typical1
Maximum
Units
Jabber Timing
Maximum transmit time
20
150
ms
Unjab time
250
750
ms
Link Integrity
Timing
Time link loss receive
50
150
ms
Link min receive
2
7
ms
Link max receive
50
150
ms
Link transmit period
8
10
24
ms
1. Typical values are at 25 °C, are for design aid only, are not guaranteed, and are not subject to production
testing.
Table 7.
I/O Electrical Characteristics (Sheet 2 of 2)
Parameter
Sym
Min
Typ1
Max
Units
Test Conditions
1. Typical values are at 25 °C, are for design aid only, are not guaranteed, and are not subject to production
testing.
2. Limited functional tests are performed at these input levels. The majority of functional tests are performed
at levels of 0V and 3V. This applies to all inputs except TPIP and TPIN.
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