参数资料
型号: XCV812E-8BG560C
厂商: Xilinx Inc
文件页数: 89/118页
文件大小: 0K
描述: IC FPGA 1.8V C-TEMP 560-MBGA
产品变化通告: FPGA Family Discontinuation 18/Apr/2011
标准包装: 1
系列: Virtex®-E EM
LAB/CLB数: 4704
逻辑元件/单元数: 21168
RAM 位总计: 1146880
输入/输出数: 404
门数: 254016
电源电压: 1.71 V ~ 1.89 V
安装类型: 表面贴装
工作温度: 0°C ~ 85°C
封装/外壳: 560-LBGA,金属
供应商设备封装: 560-MBGA(42.5x42.5)
Virtex-E 1.8 V Extended Memory Field Programmable Gate Arrays
Module 3 of 4
DS025-3 (v3.0) March 21, 2014
16
R
— OBSOLETE — OBSOLETE — OBSOLETE — OBSOLETE —
Virtex-E Pin-to-Pin Output Parameter Guidelines
All devices are 100% functionally tested. Listed below are representative values for typical pin locations and normal clock
loading. Values are expressed in nanoseconds unless otherwise noted.
Global Clock Input to Output Delay for LVTTL, 12 mA, Fast Slew Rate, with DLL
Global Clock Input to Output Delay for LVTTL, 12 mA, Fast Slew Rate, without DLL
Description(1)
Symbol
Device(3)
Speed Grade(2)
Units
Min
-8
-7
-6
LVTTL Global Clock Input to Output Delay using
Output Flip-flop, 12 mA, Fast Slew Rate, with
DLL.
For data output with different standards, adjust
the delays with the values shown in ‘‘IOB Output
TICKOFDLL
XCV405E
1.0
3.1
ns
XCV812E
1.0
3.1
ns
Notes:
1.
Listed above are representative values where one global clock input drives one vertical clock line in each accessible column, and
where all accessible IOB and CLB flip-flops are clocked by the global clock net.
2.
Output timing is measured at 50% VCC threshold with 35 pF external capacitive load. For other I/O standards and different loads, see
3.
DLL output jitter is already included in the timing calculation.
Description(1)
Symbol
Device
Speed Grade(2)
Units
Min
-8
-7
-6
LVTTL Global Clock Input to Output Delay using
Output Flip-flop, 12 mA, Fast Slew Rate, without
DLL.
For data output with different standards, adjust
the delays with the values shown in ‘‘IOB Output
TICKOF
XCV405E
1.6
4.5
4.7
4.9
ns
XCV812E
1.8
4.8
5.0
5.2
ns
Notes:
1.
Listed above are representative values where one global clock input drives one vertical clock line in each accessible column, and
where all accessible IOB and CLB flip-flops are clocked by the global clock net.
2.
Output timing is measured at 50% VCC threshold with 35 pF external capacitive load. For other I/O standards and different loads, see
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