参数资料
型号: A1010B-1PL68I
厂商: Microsemi SoC
文件页数: 78/98页
文件大小: 0K
描述: IC FPGA 1200 GATES 68-PLCC IND
标准包装: 19
系列: ACT™ 1
LAB/CLB数: 295
输入/输出数: 57
门数: 1200
电源电压: 4.5 V ~ 5.5 V
安装类型: 表面贴装
工作温度: -40°C ~ 85°C
封装/外壳: 68-LCC(J 形引线)
供应商设备封装: 68-PLCC(24.23x24.23)
8
Ac t e l MI L- S T D- 8 83 P r o d u c t Fl o w
Step
Screen
883 Method
883—Class B
Requirement
1.
Internal Visual
2010, Test Condition B
100%
2.
Temperature Cycling
1010, Test Condition C
100%
3.
Constant Acceleration
2001, Test Condition D or E,
Y1, Orientation Only
100%
4.
Seal
a. Fine
b. Gross
1014
100%
5.
Visual Inspection
2009
100%
6.
Pre-Burn-In
Electrical Parameters
In accordance with applicable Actel
device specification
100%
7.
Burn-in Test
1015, Condition D,
160 hours @ 125°C or 80 hours @ 150°C
100%
8.
Interim (Post-Burn-In)
Electrical Parameters
In accordance with applicable Actel
device specification
100%
9.
Percent Defective Allowable
5%
All Lots
10.
Final Electrical Test
a. Static Tests
(1) 25°C
(Subgroup 1, Table I)
(2) –55°C and +125°C
(Subgroups 2, 3, Table I)
b. Functional Tests
(1) 25°C
(Subgroup 7, Table I)
(2) –55°C and +125°C
(Subgroups 8A and 8B, Table I)
c. Switching Tests at 25°C
(Subgroup 9, Table I)
In accordance with applicable Actel
device specification, which includes a, b, and c:
5005
100%
11.
External Visual
2009
100%
Note:
When Destructive Physical Analysis (DPA) is performed on Class B devices, the step coverage requirement as specified in Method 2018
must be waived.
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