参数资料
型号: AD9609BCPZRL7-20
厂商: Analog Devices Inc
文件页数: 17/32页
文件大小: 0K
描述: IC ADC 10BIT SPI/SRL 20M 32LFCSP
标准包装: 1,500
位数: 10
采样率(每秒): 20M
数据接口: 串行,SPI?
转换器数目: 1
功率耗散(最大): 52mW
电压电源: 模拟和数字
工作温度: -40°C ~ 85°C
安装类型: 表面贴装
封装/外壳: 32-VFQFN 裸露焊盘,CSP
供应商设备封装: 32-LFCSP-VQ
包装: 带卷 (TR)
输入数目和类型: 2 个单端,单极;1 个差分,单极
AD9609
Rev. 0 | Page 24 of 32
BUILT-IN SELF-TEST (BIST) AND OUTPUT TEST
The AD9609 includes a built-in test feature designed to enable
verification of the integrity of each channel as well as to facili-
tate board level debugging. A built-in self-test (BIST) feature that
verifies the integrity of the digital datapath of the AD9609 is
included. Various output test options are also provided to place
predictable values on the outputs of the AD9609.
BUILT-IN SELF-TEST (BIST)
The BIST is a thorough test of the digital portion of the selected
AD9609 signal path. Perform the BIST test after a reset to ensure
that the part is in a known state. During BIST, data from an internal
pseudorandom noise (PN) source is driven through the digital
datapath of both channels, starting at the ADC block output.
At the datapath output, CRC logic calculates a signature from
the data. The BIST sequence runs for 512 cycles and then stops.
Once completed, the BIST compares the signature results with a
pre-determined value. If the signatures match, the BIST sets Bit 0
of Register 0x24, signifying the test passed. If the BIST test failed,
Bit 0 of Register 0x24 is cleared. The outputs are connected
during this test, so the PN sequence can be observed as it runs.
Writing 0x05 to Register 0x0E runs the BIST. This enables the Bit 0
(BIST enable) of Register 0x0E and resets the PN sequence
generator, Bit 2 (BIST INIT) of Register 0x0E. At the completion of
the BIST, Bit 0 of Register 0x24 is automatically cleared. The PN
sequence can be continued from its last value by writing a 0 in
Bit 2 of Register 0x0E. However, if the PN sequence is not reset,
the signature calculation does not equal the predetermined
value at the end of the test. At that point, the user needs to rely
on verifying the output data.
OUTPUT TEST MODES
The output test options are described in Table 17 at Address
0x0D. When an output test mode is enabled, the analog section
of the ADC is disconnected from the digital back-end blocks
and the test pattern is run through the output formatting block.
Some of the test patterns are subject to output formatting, and
some are not. The PN generators from the PN sequence tests
can be reset by setting Bit 4 or Bit 5 of Register 0x0D. These
tests can be performed with or without an analog signal (if
present, the analog signal is ignored), but they do require an
encode clock. For more information, see the AN-877
Application Note, Interfacing to High Speed ADCs via SPI.
相关PDF资料
PDF描述
VE-B7K-MW-S CONVERTER MOD DC/DC 40V 100W
VE-23P-IU-S CONVERTER MOD DC/DC 13.8V 200W
VE-264-IU-S CONVERTER MOD DC/DC 48V 200W
VE-B3H-IX-B1 CONVERTER MOD DC/DC 52V 75W
D38999/24JD18PNLC CONN HSG RCPT 18POS JAM NUT PINS
相关代理商/技术参数
参数描述
AD9609BCPZRL7-40 功能描述:IC ADC 10BIT SPI/SRL 40M 32LFCSP RoHS:是 类别:集成电路 (IC) >> 数据采集 - 模数转换器 系列:- 标准包装:1,000 系列:- 位数:16 采样率(每秒):45k 数据接口:串行 转换器数目:2 功率耗散(最大):315mW 电压电源:模拟和数字 工作温度:0°C ~ 70°C 安装类型:表面贴装 封装/外壳:28-SOIC(0.295",7.50mm 宽) 供应商设备封装:28-SOIC W 包装:带卷 (TR) 输入数目和类型:2 个单端,单极
AD9609BCPZRL7-65 功能描述:IC ADC 10BIT SPI/SRL 65M 32LFCSP RoHS:是 类别:集成电路 (IC) >> 数据采集 - 模数转换器 系列:- 标准包装:1,000 系列:- 位数:16 采样率(每秒):45k 数据接口:串行 转换器数目:2 功率耗散(最大):315mW 电压电源:模拟和数字 工作温度:0°C ~ 70°C 安装类型:表面贴装 封装/外壳:28-SOIC(0.295",7.50mm 宽) 供应商设备封装:28-SOIC W 包装:带卷 (TR) 输入数目和类型:2 个单端,单极
AD9609BCPZRL7-80 功能描述:IC ADC 10BIT SRL/SPI 80M 32LFCSP RoHS:是 类别:集成电路 (IC) >> 数据采集 - 模数转换器 系列:- 标准包装:1,000 系列:- 位数:16 采样率(每秒):45k 数据接口:串行 转换器数目:2 功率耗散(最大):315mW 电压电源:模拟和数字 工作温度:0°C ~ 70°C 安装类型:表面贴装 封装/外壳:28-SOIC(0.295",7.50mm 宽) 供应商设备封装:28-SOIC W 包装:带卷 (TR) 输入数目和类型:2 个单端,单极
AD9609XCPZ-40 功能描述:IC ADC 10BIT SPI/SRL 40M 制造商:analog devices inc. 系列:* 零件状态:上次购买时间 标准包装:1
AD9609XCPZ-80 功能描述:IC ADC 10BIT SRL/SPI 80M 制造商:analog devices inc. 系列:* 零件状态:上次购买时间 标准包装:1