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参数资料
| 型号： | AD9629BCPZRL7-65 |
| 厂商： | Analog Devices Inc |
| 文件页数： | 16/32页 |
| 文件大小： | 0K |
| 描述： | IC ADC 12BIT 65MSPS 32LFCSP |
| 标准包装： | 1,500 |
| 位数： | 12 |
| 采样率（每秒）： | 65M |
| 数据接口： | 串行，SPI? |
| 转换器数目： | 1 |
| 功率耗散（最大）： | 86mW |
| 电压电源： | 模拟和数字 |
| 工作温度： | -40°C ~ 85°C |
| 安装类型： | 表面贴装 |
| 封装/外壳： | 32-VFQFN 裸露焊盘，CSP |
| 供应商设备封装： | 32-LFCSP-VQ |
| 包装： | 带卷 (TR) |
| 输入数目和类型： | 2 个单端，单极；1 个差分，单极 |
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AD9629
Rev. 0 | Page 23 of 32
BUILT-IN SELF-TEST (BIST) AND OUTPUT TEST
The AD9629 includes a built-in self-test feature designed to
enable verification of the integrity of each channel as well as to
facilitate board level debugging. A built-in self-test (BIST) feature
that verifies the integrity of the digital datapath of the AD9629
is included. Various output test options are also provided to place
predictable values on the outputs of the AD9629.
BUILT-IN SELF-TEST (BIST)
The BIST is a thorough test of the digital portion of the selected
AD9629 signal path. Perform the BIST test after a reset to ensure
the part is in a known state. During BIST, data from an internal
pseudorandom noise (PN) source is driven through the digital
datapath of both channels, starting at the ADC block output.
At the datapath output, CRC logic calculates a signature from
the data. The BIST sequence runs for 512 cycles and then stops.
Once completed, the BIST compares the signature results with a
predetermined value. If the signatures match, the BIST sets Bit 0
of Register 0x24, signifying the test passed. If the BIST test failed,
Bit 0 of Register 0x24 is cleared. The outputs are connected
during this test, so the PN sequence can be observed as it runs.
Writing 0x05 to Register 0x0E runs the BIST. This enables the Bit 0
(BIST enable) of Register 0x0E and resets the PN sequence
generator, Bit 2 (BIST INIT) of Register 0x0E. At the completion
of the BIST, Bit 0 of Register 0x24 is automatically cleared. The PN
sequence can be continued from its last value by writing a 0 in
Bit 2 of Register 0x0E. However, if the PN sequence is not reset,
the signature calculation does not equal the predetermined
value at the end of the test. At that point, the user needs to rely
on verifying the output data.
OUTPUT TEST MODES
The output test options are described in Table 16 at Address
0x0D. When an output test mode is enabled, the analog section
of the ADC is disconnected from the digital back-end blocks
and the test pattern is run through the output formatting block.
Some of the test patterns are subject to output formatting, and
some are not. The PN generators from the PN sequence tests
can be reset by setting Bit 4 or Bit 5 of Register 0x0D. These
tests can be performed with or without an analog signal (if
present, the analog signal is ignored), but they do require an
encode clock. For more information, see the AN-877
Application Note, Interfacing to High Speed ADCs via SPI.
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相关代理商/技术参数 |
参数描述 |
|---|---|
| AD9629BCPZRL7-80 | 功能描述:IC ADC 12BIT 80MSPS 32LFCSP RoHS:是 类别:集成电路 (IC) >> 数据采集 - 模数转换器 系列:- 标准包装:1 系列:- 位数:14 采样率（每秒）:83k 数据接口:串行，并联 转换器数目:1 功率耗散（最大）:95mW 电压电源:双 ± 工作温度:0°C ~ 70°C 安装类型:通孔 封装/外壳:28-DIP（0.600"，15.24mm） 供应商设备封装:28-PDIP 包装:管件 输入数目和类型:1 个单端，双极 |
| AD9629XCPZ-40 | 功能描述:IC ADC 12BIT 40MSPS 制造商:analog devices inc. 系列:* 零件状态:上次购买时间 标准包装:1 |
| AD9630 | 制造商:AD 制造商全称:Analog Devices 功能描述:Low Distortion 750 MHz Closed-Loop Buffer Amp |
| AD9630AN | 制造商:AD 制造商全称:Analog Devices 功能描述:Low Distortion 750 MHz Closed-Loop Buffer Amp |
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