参数资料
型号: ADN2811ACPZ-CML
厂商: Analog Devices Inc
文件页数: 6/20页
文件大小: 0K
描述: IC CLK/DATA REC W/AMP 48-LFCSP
标准包装: 1
类型: 时钟和数据恢复(CDR),多路复用器
PLL:
主要目的: SONET/SDH,STM
输入: CML
输出: CML
电路数: 1
比率 - 输入:输出: 1:2
差分 - 输入:输出: 是/是
频率 - 最大: 2.66GHz
电源电压: 3 V ~ 3.6 V
工作温度: -40°C ~ 85°C
安装类型: 表面贴装
封装/外壳: 48-VFQFN 裸露焊盘,CSP
供应商设备封装: 48-LFCSP
包装: 托盘
ADN2811
Rev. B | Page 14 of 20
50
50
QUANTIZER
+
ADN2811
VREF
NIN
PIN
50
50
VCC
TDINP/N
LOOPEN
BYPASS
CDR
RETIMED
DATA
CLK
0
1
10
DATAOUTP/N
CLKOUTP/N SQUELCH
FROM
QUANTIZER
OUTPUT
03019-B
-018
Figure 18. Test Modes
SQUELCH MODE
When the squelch input is driven to a TTL high state, both the
clock and data outputs are set to the zero state to suppress
downstream processing. If desired, this pin can be directly
driven by the LOS detector output, SDOUT. If the squelch
function is not required, the pin should be tied to VEE.
TEST MODES: BYPASS AND LOOPBACK
When the bypass input is driven to a TTL high state, the
quantizer output is connected directly to the buffers driving the
data out pins, thus bypassing the clock recovery circuit (see
Figure 18). This feature can help the system deal with
nonstandard bit rates.
The loopback mode can be invoked by driving the LOOPEN
pin to a TTL high state, which facilitates system diagnostic
testing. This connects the test inputs (TDINP/N) to the clock
and data recovery circuit (per Figure 18). The test inputs have
internal 50 terminations and can be left floating when not in
use. TDINP/N are CML inputs and can only be dc-coupled
when being driven by CML outputs. The TDINP/N inputs must
be ac-coupled if being driven by anything other than CML
outputs. Bypass and loopback modes are mutually exclusive.
Only one of these modes can be used at any given time. The
ADN2811 is put into an indeterminate state if the BYPASS and
LOOPEN pins are set to Logic 1 at the same time.
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