参数资料
| 型号： | ADN2814ACPZ |
| 厂商： | Analog Devices Inc |
| 文件页数： | 4/28页 |
| 文件大小： | 0K |
| 描述： | IC CLOCK/DATA RECOVERY 32LFCSP |
| 标准包装： | 1 |
| 类型： | 时钟和数据恢复（CDR），多路复用器 |
| PLL： | 是 |
| 主要目的： | SONET/SDH |
| 输入： | CML |
| 输出： | LVDS |
| 电路数： | 1 |
| 比率 - 输入:输出： | 1:2 |
| 差分 - 输入:输出： | 是/是 |
| 频率 - 最大： | 675MHz |
| 电源电压： | 3 V ~ 3.6 V |
| 工作温度： | -40°C ~ 85°C |
| 安装类型： | 表面贴装 |
| 封装/外壳： | 32-VFQFN 裸露焊盘，CSP |
| 供应商设备封装： | 32-LFCSP-VQ（5x5） |
| 包装： | 托盘 |
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ADN2814
Data Sheet
Rev. C | Page 12 of 28
TERMINOLOGY
Input Sensitivity and Input Overdrive
Sensitivity and overdrive specifications for the quantizer involve
offset voltage, gain, and noise. The relationship between the
logic output of the quantizer and the analog voltage input is
shown in Figure 12. For sufficiently large positive input voltage,
the output is always Logic 1, and similarly for negative inputs,
the output is always Logic 0. However, the transitions between
output Logic Level 1 and output Logic Level 0 are not at
precisely defined input voltage levels, but occur over a range of
input voltages. Within this range of input voltages, the output
may be either 1 or 0, or it may even fail to attain a valid logic
state. The width of this zone is determined by the input voltage
noise of the quantizer. The center of the zone is the quantizer
input offset voltage. Input overdrive is the magnitude of signal
required to guarantee the correct logic level with 1 × 1010
confidence level.
NOISE
OUTPUT
INPUT (V p-p)
OFFSET
OVERDRIVE
SENSITIVITY
(2
× OVERDRIVE)
1
0
04949-
012
Figure 12. Input Sensitivity and Input Overdrive
Single-Ended vs. Differential
AC coupling is typically used to drive the inputs to the
quantizer. The inputs are internally dc biased to a common-
mode potential of ~2.5 V. Driving the ADN2814 single-ended
and observing the quantizer input with an oscilloscope probe at
the point indicated in Figure 13 shows a binary signal with an
average value equal to the common-mode potential and
instantaneous values both above and below the average value.
It is convenient to measure the peak-to-peak amplitude of this
signal and call the minimum required value the quantizer
sensitivity. Referring to Figure 13, because both positive and
negative offsets need to be accommodated, the sensitivity is
twice the overdrive. The ADN2814 quantizer typically has
3.3 mV p-p sensitivity.
SCOPE
PROBE
PIN
50
Ω
3k
Ω
2.5V
50
Ω
VREF
ADN2814
QUANTIZER
+
–
10mV p-p
VREF
04949-
013
Figure 13. Single-Ended Sensitivity Measurement
Driving the ADN2814 differentially (see Figure 14), sensitivity
seems to improve from observing the quantizer input with an
oscilloscope probe. This is an illusion caused by the use of a
single-ended probe. A 5 mV p-p signal appears to drive the
ADN2814 quantizer. However, the single-ended probe measures
only half the signal. The true quantizer input signal is twice this
value, because the other quantizer input is a complementary
signal to the signal being observed.
SCOPE
PROBE
PIN
50
Ω
3k
Ω
2.5V
50
Ω
VREF
QUANTIZER
+
–
NIN
5mV p-p
VREF
5mV p-p
VREF
04949-014
Figure 14. Differential Sensitivity Measurement
LOS Response Time
LOS response time is the delay between removal of the input
signal and indication of loss of signal (LOS) at the LOS output,
Pin 22. When the inputs are dc-coupled, the LOS assert time of
the AD2814 is 500 ns typical and the deassert time is 400 ns
typical. In practice, the time constant produced by the ac
coupling at the quantizer input and the 50 Ω on-chip input
termination determines the LOS response time.
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