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参数资料
| 型号： | ADP5585CP-EVALZ |
| 厂商： | Analog Devices Inc |
| 文件页数： | 4/40页 |
| 文件大小： | 0K |
| 描述： | BOARD EVAL FOR ADP5585CP |
| 标准包装： | 1 |
| 主要目的： | 接口，GPIO 扩展器 |
| 已用 IC / 零件： | ADP5585 |
| 主要属性： | 10 个可配置的 I/O |
| 次要属性： | I²C 接口 |
| 已供物品： | 板 |
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ADP5585
Data Sheet
Rev. C | Page 12 of 40
GPI INPUT
Each of the 10 input/output lines can be configured as a
general-purpose logic input line. Figure 15 shows a detailed
representation of the GPI scan and detect block and its
associated control and status signals.
PIN_CONFIG_A[7:0]
PIN_CONFIG_B[7:0]
GPI_INT
GPIO 1
GPIO 2
GPIO 3
GPIO 4
GPIO 5
GPIO 6
GPIO 7
GPIO 8
GPIO 9
(R0)
(R1)
(R2)
(R3)
(R4)
RST/(R5)
(C0)
(C1)
(C2)
GPIO 10
GPIO 11
(C3)
(C4)
GPI EVENT
KEY EVENT
OVRFLOW_INT
LOGIC EVENT
GPI_INT_LEVEL_A[7:0]
GPI_INT_LEVEL_B[7:0]
GPI_INTERRUPT_EN_A[7:0]
GPIO_DIRECTION_A[7:0]
GPI_STATUS_A[5:0]
GPI_STATUS_B[4:0]
GPI_INT_STAT_A[5:0]
GPI_EVENT_EN_A[7:0]
GPIO_DIRECTION_B[7:0]
GPI_INTERRUPT_EN_B[7:0]
GPI_EVENT_EN_B[7:0]
EVENT_INT
GPI_INT_STAT_B[4:0]
RESET_TRIG_TIME[2:0]
RESET1_EVENT_A[7:0]
RESET1_EVENT_B[7:0]
RESET1_EVENT_C[7:0]
RESET2_EVENT_A[7:0]
RESET2_EVENT_B[7:0]
FIFO1:FIFO16
EC[4:0]
09841-
014
FIFO
UPDATE
GPI SCAN
CONTROL
I2C BUSY
Figure 15. GPI Scan and Detect Block
The current input state of each GPI can be read back using the
GPI_STATUS_x registers. Each GPI can be programmed to
generate an interrupt via the GPI_INTERRUPT_EN_x registers.
The interrupt status is stored in the GPI_INT_STAT_x registers.
GPI interrupts can be programmed to trigger on the positive or
negative edge by configuring the GPI_INT_LEVEL_x registers.
If any of the GPI interrupts is triggered, the master GPI_INT
interrupt is also triggered. Figure 16 shows a single GPI and
how it affects its corresponding status and interrupt status bits.
GPI 3
GPI_STATUS_A[3]
GPI_INTERRUPT_EN_A[3]
GPI_INT_STAT_A[3]
GPI_INT
GPI_INT_LEVEL_A[3]
09841-
015
CLEARED
BY READ
CLEARED
BY WRITE ‘1’
Figure 16. Single GPI Example
GPIs can be programmed to generate FIFO events via the
GPI_EVENT_EN_x registers. GPIs in this mode do not generate
GPI_INT interrupts and instead generate EVENT_INT interrupts.
Figure 17 shows several GPI lines and their effects on the FIFO
and event count, EC[4:0].
GPI 2
GPI SCAN
EVENT_INT
EC[4:0]
1
6
GPI 2 ACTIVE
GPI 4
GPI 7
2
3
4
5
GPI 7 ACTIVE
GPI 4 ACTIVE
GPI 4 INACTIVE
GPI 7 INACTIVE
GPI 2 INACTIVE
FIFO
1
0
38
43
40
09841-
016
Figure 17. Multiple GPI Example
The GPI scanner is idle until it detects a level transition. It scans
the GPI inputs and updates accordingly. It then returns to idle
immediately, it does not scan/wait, like the key scanner. As
such, the GPI scanner can detect narrow pulses once they get
past the 50 μs input debounce filter.
GPO OUTPUT
Each of the 10 input/output lines can be configured as a general-
purpose output (GPO) line. Figure 6 shows a detailed diagram
of the I/O structure. See the Detailed Register Descriptions
section for GPO configuration and usage.
LOGIC BLOCKS
Several of the ADP5585 input/output lines can be used as inputs
and outputs for implementing some common logic functions.
The R1, R2, and R3 input/output pins can be used as inputs,
and the R0 input/output pin can be used as an output for the
logic block.
The outputs from the logic blocks can be configured to generate
interrupts. They can also be configured to generate events on
the FIFO.
Figure 19 shows a detailed diagram of the internal make-up of
the logic block, illustrating the possible logic functions that can
be implemented.
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