参数资料
型号: ADSP-BF533SBB500
厂商: Analog Devices Inc
文件页数: 45/64页
文件大小: 0K
描述: IC DSP CTLR 16BIT 500MHZ 169-BGA
产品培训模块: Blackfin® Processor Core Architecture Overview
Blackfin® Device Drivers
Blackfin® Optimizations for Performance and Power Consumption
Blackfin® System Services
标准包装: 1
系列: Blackfin®
类型: 定点
接口: SPI,SSP,UART
时钟速率: 500MHz
非易失内存: ROM(1 kB)
芯片上RAM: 148kB
电压 - 输入/输出: 3.30V
电压 - 核心: 1.20V
工作温度: -40°C ~ 85°C
安装类型: 表面贴装
封装/外壳: 169-BBGA
供应商设备封装: 169-PBGA(19x19)
包装: 托盘
配用: ADZS-BFAUDIO-EZEXT-ND - BOARD EVAL AUDIO BLACKFIN
ADZS-BFAV-EZEXT-ND - BOARD DAUGHT ADSP-BF533,37,61KIT
ADZS-BF533-EZLITE-ND - KIT W/BOARD EVAL FOR ADSP-BF533
ADSP-BF531 / ADSP-BF532 / ADSP-BF533
TEST CONDITIONS
All timing parameters appearing in this data sheet were mea-
sured under the conditions described in this section. Figure 45
shows the measurement point for ac measurements (except out-
put enable/disable). The measurement point V MEAS is 0.95 V for
V DDEXT (nominal) = 1.8 V or 1.5 V for V DDEXT (nominal) = 2.5 V/
The time t DECAY is calculated with test loads C L and I L , and with
? V equal to 0.1 V for V DDEXT (nominal) = 1.8 V or 0.5 V for
V DDEXT (nominal) = 2.5 V/3.3 V.
The time t DIS_MEASURED is the interval from when the reference
signal switches, to when the output voltage decays ? V from the
measured output high or output low voltage.
3.3 V.
REFERENCE
SIGNAL
INPUT
OR
OUTPUT
V MEAS
V MEAS
t DIS_MEASURED
t ENA_MEASURED
t DIS
t ENA
Figure 45. Voltage Reference Levels for AC
Measurements (Except Output Enable/Disable)
Output Enable Time Measurement
V OH
(MEASURED)
V OL
(MEASURED)
V OH (MEASURED)
V OL (MEASURED) +
t DECAY
V
V
V OH (MEASURED)
V TRIP (HIGH)
V TRIP (LOW)
V OL (MEASURED)
t TRIP
Output pins are considered to be enabled when they have made
a transition from a high impedance state to the point when they
start driving.
OUTPUT STOPS DRIVING
OUTPUT STARTS DRIVING
The output enable time t ENA is the interval from the point when
a reference signal reaches a high or low voltage level to the point
when the output starts driving as shown on the right side of
The time t ENA_MEASURED is the interval, from when the reference
signal switches, to when the output voltage reaches V TRIP (high)
or V TRIP (low).
For V DDEXT (nominal) = 1.8 V—V TRIP (high) is 1.3 V and V TRIP
(low) is 0.7 V.
For V DDEXT (nominal) = 2.5 V/3.3 V—V TRIP (high) is 2.0 V and
V TRIP (low) is 1.0 V.
Time t TRIP is the interval from when the output starts driving to
when the output reaches the V TRIP (high) or V TRIP (low) trip
voltage.
Time t ENA is calculated as shown in the equation:
t ENA = t ENA_MEASURED – t TRIP
If multiple pins (such as the data bus) are enabled, the measure-
ment value is that of the first pin to start driving.
Output Disable Time Measurement
Output pins are considered to be disabled when they stop driv-
ing, go into a high impedance state, and start to decay from their
output high or low voltage. The output disable time t DIS is the
difference between t DIS_MEASURED and t DECAY as shown on the left
side of Figure 45 .
t DIS = t DIS_MEASURED – t DECAY
The time for the voltage on the bus to decay by ? V is dependent
on the capacitive load C L and the load current I I . This decay time
can be approximated by the equation:
t DECAY = ? C L ? V ? ? I L
HIGH IMPEDANCE STATE
Figure 46. Output Enable/Disable
Example System Hold Time Calculation
To determine the data output hold time in a particular system,
first calculate t DECAY using the equation given above. Choose ? V
to be the difference between the processor’s output voltage and
the input threshold for the device requiring the hold time. C L is
the total bus capacitance (per data line), and I L is the total leak-
age or three-state current (per data line). The hold time is t DECAY
plus the various output disable times as specified in the Timing
Specifications on Page 27 (for example t DSDAT for an SDRAM
write cycle as shown in SDRAM Interface Timing on Page 30 ).
Rev. I
|
Page 45 of 64 |
August 2013
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