参数资料
型号: CAT93C86VI-GT3
厂商: ON Semiconductor
文件页数: 2/10页
文件大小: 0K
描述: IC EEPROM 16KBIT 3MHZ 8SOIC
标准包装: 1
格式 - 存储器: EEPROMs - 串行
存储器类型: EEPROM
存储容量: 16K(2K x 8 或 1K x 16)
速度: 3MHz
接口: Microwire 3 线串行
电源电压: 2.5 V ~ 5.5 V
工作温度: -40°C ~ 85°C
封装/外壳: 8-SOIC(0.154",3.90mm 宽)
供应商设备封装: 8-SOIC
包装: 标准包装
产品目录页面: 807 (CN2011-ZH PDF)
其它名称: CAT93C86VI-GT3DKR
CAT93C86
Table 1. ABSOLUTE MAXIMUM RATINGS
Parameters
Temperature Under Bias
Storage Temperature
Voltage on any Pin with Respect to Ground (Note 1)
V CC with Respect to Ground
Package Power Dissipation Capability (T A = 25 ° C)
Lead Soldering Temperature (10 seconds)
Output Short Circuit Current (Note 2)
Ratings
? 55 to +125
? 65 to +150
? 2.0 to +V CC +2.0
? 2.0 to +7.0
1.0
300
100
Units
° C
° C
V
V
W
° C
mA
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
1. The minimum DC input voltage is ? 0.5 V. During transitions, inputs may undershoot to ? 2.0 V for periods of less than 20 ns. Maximum DC
voltage on output pins is V CC +0.5 V, which may overshoot to V CC +2.0 V for periods of less than 20 ns.
2. Output shorted for no more than one second. No more than one output shorted at a time.
Table 2. RELIABILITY CHARACTERISTICS
Symbol
N END (Note 3)
T DR (Note 3)
V ZAP (Note 3)
I LTH (Notes 3, 4)
Parameter
Endurance
Data Retention
ESD Susceptibility
Latch ? Up
Reference Test Method
MIL ? STD ? 883, Test Method 1033
MIL ? STD ? 883, Test Method 1008
MIL ? STD ? 883, Test Method 3015
JEDEC Standard 17
Min
1,000,000
100
2000
100
Units
Cycles/Byte
Years
V
mA
3. These parameters are tested initially and after a design or process change that affects the parameter.
4. Latch ? up protection is provided for stresses up to 100 mA on address and data pins from ? 1 V to V CC +1 V.
Table 3. D.C. OPERATING CHARACTERISTICS (V CC = +1.8 V to +5.5 V unless otherwise specified.)
Symbol
I CC1
I CC2
I SB1
I SB2
I LI
I LO
V IL1
V IH1
V IL2
V IH2
Parameter
Power Supply Current (Write)
Power Supply Current (Read)
Power Supply Current
(Standby) (x8 Mode)
Power Supply Current
(Standby) (x16 Mode)
Input Leakage Current
Output Leakage Current
(Including ORG pin)
Input Low Voltage
Input High Voltage
Input Low Voltage
Input High Voltage
Test Conditions
f SK = 1 MHz; V CC = 5.0 V
f SK = 1 MHz; V CC = 5.0 V
CS = 0 V ORG = GND
CS = 0 V ORG = Float or V CC
V IN = 0 V to V CC
V OUT = 0 V to V CC , CS = 0 V
4.5 V ≤ V CC < 5.5 V
4.5 V ≤ V CC < 5.5 V
1.8 V ≤ V CC < 4.5 V
1.8 V ≤ V CC < 4.5 V
Min
? 0.1
2
0
V CC x 0.7
Typ
0
Max
3
500
10
10
1
1
0.8
V CC + 1
V CC x 0.2
V CC + 1
Units
mA
m A
m A
m A
m A
m A
V
V
V
V
V OL1
V OH1
V OL2
V OH2
Output Low Voltage
Output High Voltage
Output Low Voltage
Output High Voltage
4.5 V ≤ V CC < 5.5 V; I OL = 2.1 mA
4.5 V ≤ V CC < 5.5 V; I OH = ? 400 m A
1.8 V ≤ V CC < 4.5 V; I OL = 1 mA
1.8 V ≤ V CC < 4.5 V; I OH = ? 100 m A
2.4
V CC ? 0.2
0.4
0.2
V
V
V
V
http://onsemi.com
2
相关PDF资料
PDF描述
M1A3P1000L-FGG256I IC FPGA M1 1KB FLASH 1M 256FBGA
956-009-010R011 BACKSHELL 9POS STR SNAP PLAS BLK
10368-12R1-00 JUNCTION SHELL 68POS METAL
M1A3P1000L-FG256I IC FPGA M1 1KB FLASH 1M 256FBGA
EP4CE40F29I7N IC CYCLONE IV FPGA 40K 780FBGA
相关代理商/技术参数
参数描述
CAT93C86VIG-T3 制造商:ON Semiconductor 功能描述:EEPROM Serial-Microwire 16K-bit 2K x 8/1K x 16 2.5V/3.3V/5V 8-Pin SOIC N T/R
CAT93C86VI-GT3 制造商:ON Semiconductor 功能描述:IC EEPROM 16KBIT SERIAL 3MHZ SOIC-8
CAT93C86VI-GT3-CUT TAPE 制造商:ON 功能描述:CAT93C Series 16 kb (1kX16) 3 MHz 1.8 to 5.5 V Microwire Serial EEPROM - SOIC-8
CAT93C86VI-TE13 制造商:Rochester Electronics LLC 功能描述: 制造商:Catalyst Semiconductor 功能描述:
CAT93C86V-TE13 功能描述:电可擦除可编程只读存储器 (2048x8)(1024x16)16K RoHS:否 制造商:Atmel 存储容量:2 Kbit 组织:256 B x 8 数据保留:100 yr 最大时钟频率:1000 KHz 最大工作电流:6 uA 工作电源电压:1.7 V to 5.5 V 最大工作温度:+ 85 C 安装风格:SMD/SMT 封装 / 箱体:SOIC-8