参数资料
型号: E28F400BX-B60
厂商: INTEL CORP
元件分类: PROM
英文描述: ACTUATOR, SWITCH, ROUND, MOMENTARY; Approval Bodies:BEAB, VDE, UL, CSA; Diameter, external:29mm; IP rating:65; Operations, mechanical No. of:1000000; Temp, op. max:85(degree C); Temp, op. min:-20(degree C) RoHS Compliant: Yes
中文描述: 256K X 16 FLASH 12V PROM, 60 ns, PDSO56
封装: 20 X 14 MM, TSOP-56
文件页数: 50/50页
文件大小: 449K
代理商: E28F400BX-B60
28F400BX-TB 28F004BX-TB
15 28F400BX Pin Descriptions
Symbol
Type
Name and Function
A0–A17
I
ADDRESS INPUTS
for memory addresses Addresses are internally latched during a write
cycle
A9
I
ADDRESS INPUT
When A9 is at 12V the signature mode is accessed During this mode A0
decodes between the manufacturer and device ID’s When BYTE
is at a logic low only the
lower byte of the signatures are read DQ15 Ab1 is a don’t care in the signature mode when
BYTE
is low
DQ0–DQ7
IO
DATA INPUTSOUTPUTS
Inputs array data on the second CE
and WE
cycle during a
program command Inputs commands to the command user interface when CE
and WE
are active Data is internally latched during the write and program cycles Outputs array
Intelligent Identifier and Status Register data The data pins float to tri-state when the chip is
deselected or the outputs are disabled
DQ8–DQ15
IO
DATA INPUTSOUTPUTS
Inputs array data on the second CE
and WE
cycle during a
program command Data is internally latched during the write and program cycles Outputs
array data The data pins float to tri-state when the chip is deselected or the outputs are
disabled as in the byte-wide mode (BYTE
e
‘‘0’’) In the byte-wide mode DQ15 Ab1
becomes the lowest order address for data output on DQ0-DQ7
CE
I
CHIP ENABLE
Activates the device’s control logic input buffers decoders and sense
amplifiers CE
is active low CE
high deselects the memory device and reduces power
consumption to standby levels If CE
and RP
are high but not at a CMOS high level the
standby current will increase due to current flow through the CE
and RP
input stages
RP
I
RESETDEEP POWER-DOWN
Provides three-state control Puts the device in deep power-
down mode Locks the boot block from programerase
When RP
is at logic high level and equals 65V maximum the boot block is locked and
cannot be programmed or erased
When RP
e
114V minimum the boot block is unlocked and can be programmed or
erased
When RP
is at a logic low level the boot block is locked the deep power-down mode is
enabled and the WSM is reset preventing any blocks from being programmed or erased
therefore providing data protection during power transitions
When RP
transitions from logic low to logic high the flash memory enters the read-array
mode
OE
I
OUTPUT ENABLE
Gates the device’s outputs through the data buffers during a read cycle
OE
is active low
WE
I
WRITE ENABLE
Controls writes to the Command Register and array blocks WE
is active
low Addresses and data are latched on the rising edge of the WE
pulse
BYTE
I
BYTE
ENABLE
Controls whether the device operates in the byte-wide mode (x8) or the
word-wide mode (x16) BYTE
pin must be controlled at CMOS levels to meet 100A CMOS
current in the standby mode BYTE
e
‘‘0’’ enables the byte-wide mode where data is read
and programmed on DQ0–DQ7 and DQ15 Ab1 becomes the lowest order address that
decodes between the upper and lower byte DQ8–DQ14 are tri-stated during the byte-wide
mode BYTE
e
‘‘1’’ enables the word-wide mode where data is read and programmed on
DQ0–DQ15
VPP
PROGRAMERASE POWER SUPPLY
For erasing memory array blocks or programming
data in each block
Note
VPP k VPPLMAX memory contents cannot be altered
VCC
DEVICE POWER SUPPLY (5V g10% 5V g5%)
GND
GROUND
For all internal circuitry
NC
NO CONNECT
Pin may be driven or left floating
DU
DON’T USE PIN
Pin should not be connected to anything
9
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