参数资料
型号: EVAL-AD5371EBZ
厂商: Analog Devices Inc
文件页数: 8/29页
文件大小: 0K
描述: BOARD EVAL FOR AD5371
产品培训模块: DAC Architectures
标准包装: 1
DAC 的数量: 40
位数: 14
采样率(每秒): 540k
数据接口: 串行
设置时间: 20µs
DAC 型: 电压
工作温度: -40°C ~ 85°C
已供物品: 板,CD
已用 IC / 零件: AD5371
相关产品: AD5371BSTZ-REEL-ND - IC DAC 14BIT 40CH SER 80-LQFP
AD5371BBCZ-REELTR-ND - IC DAC 14BIT 40CH SER 100-CSPBGA
AD5371
Rev. B | Page 15 of 28
TERMINOLOGY
Integral Nonlinearity (INL)
Integral nonlinearity, or endpoint linearity, is a measure of the
maximum deviation from a straight line passing through the
endpoints of the DAC transfer function. It is measured after
adjusting for zero-scale error and full-scale error and is
expressed in least significant bits (LSB).
Differential Nonlinearity (DNL)
Differential nonlinearity is the difference between the measured
change and the ideal 1 LSB change between any two adjacent
codes. A specified differential nonlinearity of 1 LSB maximum
ensures monotonicity.
Zero-Scale Error
Zero-scale error is the error in the DAC output voltage when
all 0s are loaded into the DAC register. Zero-scale error is a
measure of the difference between VOUT (actual) and VOUT
(ideal), expressed in millivolts (mV), when the channel is at its
minimum value. Zero-scale error is mainly due to offsets in the
output amplifier.
Full-Scale Error
Full-scale error is the error in the DAC output voltage when all
1s are loaded into the DAC register. Full-scale error is a measure
of the difference between VOUT (actual) and VOUT (ideal),
expressed in millivolts, when the channel is at its maximum
value. Full-scale error does not include zero-scale error.
Gain Error
Gain error is the difference between full-scale error and
zero-scale error. It is expressed as a percentage of the full-
scale range (FSR).
Gain Error = Full-Scale Error Zero-Scale Error
VOUT Temperature Coefficient
The VOUT temperature coefficient includes output error
contributions from linearity, offset, and gain drift.
DC Output Impedance
DC output impedance is the effective output source resistance.
It is dominated by package lead resistance.
DC Crosstalk
The DAC outputs are buffered by op amps that share common
VDD and VSS power supplies. If the dc load current changes in
one channel (due to an update), this change can result in a
further dc change in one or more channel outputs. This effect is
more significant at high load currents and is reduced as the load
currents are reduced. With high impedance loads, the effect is
virtually immeasurable. Multiple VDD and VSS terminals are
provided to minimize dc crosstalk.
Output Voltage Settling Time
Output voltage settling time is the amount of time it takes for
the output of a DAC to settle to a specified level for a full-scale
input change.
Digital-to-Analog Glitch Energy
Digital-to-analog glitch energy is the amount of energy that is
injected into the analog output at the major code transition. It
is specified as the area of the glitch in nV-s. It is measured by
toggling the DAC register data between 0x1FFF and 0x2000.
Channel-to-Channel Isolation
Channel-to-channel isolation refers to the proportion of input
signal from the reference input of one DAC that appears at the
output of another DAC operating from another reference. It is
expressed in decibels and measured at midscale.
DAC-to-DAC Crosstalk
DAC-to-DAC crosstalk is the glitch impulse that appears at the
output of one converter due to both the digital change and
subsequent analog output change at another converter. It is
specified in nV-s.
Digital Crosstalk
Digital crosstalk is defined as the glitch impulse transferred to
the output of one converter due to a change in the DAC register
code of another converter. It is specified in nV-s.
Digital Feedthrough
When the device is not selected, high frequency logic activity
on the digital inputs of the device can be capacitively coupled
both across and through the device to appear as noise on the
VOUTx pins. It can also be coupled along the supply and
ground lines. This noise is digital feedthrough.
Output Noise Spectral Density
Output noise spectral density is a measure of internally gener-
ated random noise. Random noise is characterized as a spectral
density (voltage per √Hz). It is measured by loading all DACs
to midscale and measuring noise at the output. It is measured
in nV/√Hz.
相关PDF资料
PDF描述
EMC05DRTF-S13 CONN EDGECARD 10POS .100 EXTEND
SC53LC-470 INDUCTOR SMD 47UH 0.62A 100KHZ
V375C2E50BF CONVERTER MOD DC/DC 2V 50W
101-1102 KIT DEV RABBIT RCM4100 INTL
RCC17DRXN CONN EDGECARD 34POS DIP .100 SLD
相关代理商/技术参数
参数描述
EVAL-AD5372EBZ 功能描述:BOARD EVAL FOR AD5372 RoHS:是 类别:编程器,开发系统 >> 评估板 - 数模转换器 (DAC) 系列:- 产品培训模块:Lead (SnPb) Finish for COTS Obsolescence Mitigation Program 标准包装:1 系列:- DAC 的数量:4 位数:12 采样率(每秒):- 数据接口:串行,SPI? 设置时间:3µs DAC 型:电流/电压 工作温度:-40°C ~ 85°C 已供物品:板 已用 IC / 零件:MAX5581
EVAL-AD5373EBZ 功能描述:BOARD EVAL FOR AD5373 RoHS:是 类别:编程器,开发系统 >> 评估板 - 数模转换器 (DAC) 系列:- 产品培训模块:Lead (SnPb) Finish for COTS Obsolescence Mitigation Program 标准包装:1 系列:- DAC 的数量:4 位数:12 采样率(每秒):- 数据接口:串行,SPI? 设置时间:3µs DAC 型:电流/电压 工作温度:-40°C ~ 85°C 已供物品:板 已用 IC / 零件:MAX5581
EVAL-AD5379EB 制造商:AD 制造商全称:Analog Devices 功能描述:40-Channel, 14-Bit, Parallel and Serial Input, Bipolar Voltage-Output DAC
EVAL-AD5379EBZ 功能描述:BOARD EVALUATION FOR AD5379 RoHS:是 类别:编程器,开发系统 >> 评估板 - 数模转换器 (DAC) 系列:- 产品培训模块:Lead (SnPb) Finish for COTS Obsolescence Mitigation Program 标准包装:1 系列:- DAC 的数量:4 位数:12 采样率(每秒):- 数据接口:串行,SPI? 设置时间:3µs DAC 型:电流/电压 工作温度:-40°C ~ 85°C 已供物品:板 已用 IC / 零件:MAX5581
EVAL-AD5380EB 制造商:Analog Devices 功能描述:EVALUATION BOARD I.C. - Bulk