参数资料
型号: FDD3860
厂商: Fairchild Semiconductor
文件页数: 2/6页
文件大小: 0K
描述: MOSFET N-CH 100V 6.2A DPAK
产品目录绘图: DPAK, TO-252(AA)
标准包装: 1
系列: PowerTrench®
FET 型: MOSFET N 通道,金属氧化物
FET 特点: 标准
漏极至源极电压(Vdss): 100V
电流 - 连续漏极(Id) @ 25° C: 6.2A
开态Rds(最大)@ Id, Vgs @ 25° C: 36 毫欧 @ 5.9A,10V
Id 时的 Vgs(th)(最大): 4.5V @ 250µA
闸电荷(Qg) @ Vgs: 31nC @ 10V
输入电容 (Ciss) @ Vds: 1740pF @ 50V
功率 - 最大: 3.1W
安装类型: 表面贴装
封装/外壳: TO-252-3,DPak(2 引线+接片),SC-63
供应商设备封装: TO-252
包装: 标准包装
产品目录页面: 1606 (CN2011-ZH PDF)
其它名称: FDD3860DKR
Electrical Characteristics T J = 25°C unless otherwise noted
Symbol
Parameter
Test Conditions
Min
Typ
Max
Units
Off Characteristics
BV DSS
? BV DS S
? T J
I DSS
I GSS
Drain to Source Breakdown Voltage
Breakdown Voltage Temperature
Coefficient
Zero Gate Voltage Drain Current
Gate to Source Leakage Current
I D = 250 μ A, V GS = 0V
I D = 250 μ A, referenced to 25°C
V DS = 80V, V GS = 0V
V GS = ±20V, V DS = 0V
100
98
1
±100
V
mV / °C
μ A
nA
On Characteristics
V GS(th)
? V GS(th )
? T J
r DS(on)
g FS
Gate to Source Threshold Voltage
Gate to Source Threshold Voltage
Temperature Coefficient
Static Drain to Source On Resistance
Forward Transconductance
V GS = V DS , I D = 250 μ A
I D = 250 μ A, referenced to 25°C
V GS = 10V, I D = 5.9A
V GS = 10V, I D = 5.9A, T J = 125°C
V DS = 10V, I D = 5.9A
2.5
3.8
-11.4
29
51
20
4.5
36
64
V
mV/°C
m ?
S
Dynamic Characteristics
C iss
C oss
C rss
R g
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
Gate Resistance
V DS = 50V, V GS = 0V,
f = 1MHz
f = 1MHz
1310
100
45
1.6
1740
130
70
pF
pF
pF
?
Switching Characteristics
t d(on)
t r
t d(off)
t f
Q g
Q gs
Q gd
Turn-On Delay Time
Rise Time
Turn-Off Delay Time
Fall Time
Total Gate Charge at 10V
Gate to Source Charge
Gate to Drain “Miller” Charge
V DD = 50V, I D = 5.9A,
V GS = 10V, R GEN = 6 ?
V DD = 50V, I D = 5.9A
16
10
24
7
22
7.1
6.3
29
21
39
15
31
ns
ns
ns
ns
nC
nC
nC
Drain-Source Diode Characteristics
V SD
Source to Drain Diode Forward Voltage
V GS = 0V, I S = 2.0A
V GS = 0V, I S = 5.9A
(Note 2)
(Note 2)
0.7
0.8
1.2
1.3
V
t rr
Q rr
Reverse Recovery Time
Reverse Recovery Charge
I F = 5.9A, di/dt = 100A/ μ s
34
40
55
64
ns
nC
Notes :
1: R θ JA is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of the drain pins.
R θ JC is guaranteed by design while R θ JA is determined by the user’s board design.
a) 40°C/W when mounted on a
1 in 2 pad of 2 oz copper
2: Pulse Test: Pulse Width < 30 0 μ s, Duty cycle < 2.0%.
3: Starting T J = 25 ° C , L = 3mH , I AS = 9A , V DD = 100V , V GS = 10V.
b) 96°C/W when mounted
on a minimum pad.
?2008 Fairchild Semiconductor Corporation
FDD3860 Rev.C1
2
www.fairchildsemi.com
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