参数资料
型号: HI5762EVAL2
厂商: Intersil
文件页数: 1/17页
文件大小: 0K
描述: EVALUATION MOD FOR HI5762 AMP
标准包装: 1
ADC 的数量: 2
位数: 10
采样率(每秒): 60M
数据接口: 并联
输入范围: 1 Vpp
在以下条件下的电源(标准): 650mW @ 60MSPS
工作温度: -40°C ~ 85°C
已用 IC / 零件: HI5762
已供物品:
HI5762EVAL2 Evaluation Board User’s Manual
TM
Description
Application Note
January 1999
AN9811
The HI5762EVAL2 evaluation board is made available to
allow the circuit designer the ability to evaluate the
performance of the Intersil HI5762 monolithic Dual 10-bit 60
MSPS analog-to-digital converter (ADC) with internal
voltage reference. As shown in the Evaluation Board
Functional Block Diagram, this evaluation board includes
sample clock generation circuitry, a single-ended to
differential analog input ampli?er con?guration for both the I
and Q channel inputs, an external variable voltage reference
and digital data output latches/buffers. The buffered digital
data outputs are conveniently provided for easy interfacing
to a ribbon connector or logic probes.
The sample clock generator circuit accepts the external
sampling signal through an SMA type RF connector, J3. This
input is AC-coupled and terminated in 50 ? allowing for
connection to most laboratory signal generators. In addition,
the duty cycle of the clock driving the A/D converter is made
Evaluation Board Functional Block Diagram
adjustable by way of a potentiometer so that the effects of
sample clock duty cycle on the HI5762 may be observed.
The I and Q channel analog input signals are also connected
through SMA type RF connectors, J1 and J2, and applied to
single-ended to differential analog input ampli?ers. These
inputs are AC-coupled and terminated in 50 ? allowing for
connection to most laboratory signal generators. Also,
provisions for differential RC lowpass ?lters are incorporated
on the output of the differential ampli?ers to limit the
broadband noise going into the HI5762 converter.
The I and Q channel digital data output latches/buffers
consist of a pair of 74FCT2821 D-type ?ip-?ops. The digital
data output interface provides both phases of the sampling
clock, CLK and CLK, so that the digital data transitions are
essentially time aligned with the rising edge of the CLK
sampling clock or time aligned with the falling edge of the
CLK sampling clock.
SAMPLE
CLOCK
INPUT
J3
50 ?
+5V D
BIAS
TEE
CLK
CLOCK
OUT
CLK
Q-CHANNEL
ANALOG
INPUT
(Q_IN)
J2
50 ?
G = -1
G = +1
QI IN +
QI IN -
CLK
QD 0 -QD 9
10
D
Q
10
Q-CHANNEL
DIGITAL
DATA
OUTPUT
(QD0 - QD9)
ICL8069
V ROUT
1.2V
BANDGAP
VOLTAGE
REFERENCE
VAR GAIN
+2.5V
V RIN
HI5762
I-CHANNEL
ANALOG
INPUT
(I_IN)
J1
50 ?
G = -1
G = +1
I IN +
I IN -
ID 0 -ID 9
10
D
Q
10
I-CHANNEL
DIGITAL
DATA
OUTPUT
(ID0 - ID9)
DGND
AGND
+5V D
+5V A
-5V A
3-1
1-888-INTERSIL or 321-724-7143
|
Intersil and Design is a trademark of Intersil Corporation.
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Copyright
? Intersil Corporation 2000
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