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参数资料
| 型号： | HI5762EVAL2 |
| 厂商： | Intersil |
| 文件页数： | 3/17页 |
| 文件大小： | 0K |
| 描述： | EVALUATION MOD FOR HI5762 AMP |
| 标准包装： | 1 |
| ADC 的数量： | 2 |
| 位数： | 10 |
| 采样率（每秒）： | 60M |
| 数据接口： | 并联 |
| 输入范围： | 1 Vpp |
| 在以下条件下的电源（标准）： | 650mW @ 60MSPS |
| 工作温度： | -40°C ~ 85°C |
| 已用 IC / 零件： | HI5762 |
| 已供物品： | 板 |
Application Note 9811
Figure 1 shows the test system used to perform dynamic
testing on high-speed ADCs at Intersil. The clock (CLK) and
analog input (V IN ) signals are sourced from low phase noise
HP8662A
REF
HP8662A
HP8662A synthesized signal generators that are phase
locked to each other to ensure coherence. The output of the
signal generator driving the ADC analog input is bandpass
?ltered to improve the harmonic distortion of the analog input
BANDPASS
FILTER
signal. The comparator on the evaluation board will convert
CLK
V IN
the sine wave CLK input signal to a square wave at TTL logic
levels to drive the sample clock input of the HI5762. The
COMPARATOR
I_IN/Q_IN
ADC data is captured by a logic analyzer and then
CLK
HI5762
transferred over the GPIB bus to the PC. The PC has the
I/Q DIGITAL DATA OUTPUT
required software to perform the Fast Fourier Transform
(FFT) and do the data analysis.
Coherent testing is recommended in order to avoid the
HI5762EVAL2
EVALUATION BOARD
10
inaccuracies of windowing. The sampling frequency and
analog input frequency have the following relationship: F I /F S
= M/N, where F I is the frequency of the input analog
sinusoid, F S is the sampling frequency, N is the number of
samples, and M is the number of cycles over which the
samples are taken. By making M an integer and odd number
(1, 3, 5, ...) the samples are assured of being nonrepetitive.
Refer to the HI5762 data sheet for a complete list of test
de?nitions and the results that can be expected using the
evaluation board with the test setup shown. Evaluating the
part with a reconstruction DAC is only suggested when
doing bandwidth or video testing.
SINEWAVE CLK IN
(J3)
t PD1
HI5762 SAMPLE
CLOCK INPUT
(CLK AT U7-2)
t OD
DATA ACQUISITION SYSTEM
GPIB
PC
FIGURE 1. HIGH-SPEED A/D PERFORMANCE TEST SYSTEM
HI5762 DIGITAL
DATA OUTPUT
DATA N-1
DATA N
DATA N+1
(D0 - D13)
CLOCK OUT
(CLK AT U10,U11, P1-12 AND P2-12)
t PD2
DIGITAL DATA OUTPUTS
(74FCT2821)
DATA N-1
DATA N
FIGURE 2. EVALUATION BOARD CLOCK AND DATA TIMING RELATIONSHIPS (TYPICAL)
3-3
相关PDF资料 |
PDF描述 |
|---|---|
| HI5767EVAL1 | EVALUATION PLATFORM HI5767 |
| HI5767EVAL2 | EVALUATION PLATFORM HI5767 |
| HI5805EVAL1 | EVALUATION PLATFORM HI5805 |
| HI5828EVAL2 | EVALUATION PLATFORM HI5828 |
| HI5960SOICEVAL1 | EVALUATION PLATFORM SOIC HI5960 |
相关代理商/技术参数 |
参数描述 |
|---|---|
| HI5766 | 制造商:INTERSIL 制造商全称:Intersil Corporation 功能描述:10-Bit, 60 MSPS A/D Converter |
| HI5766_05 | 制造商:INTERSIL 制造商全称:Intersil Corporation 功能描述:10-Bit, 60MSPS A/D Converter |
| HI5766EVAL1 | 制造商:Rochester Electronics LLC 功能描述:- Bulk 制造商:Harris Corporation 功能描述: |
| HI5766KCA | 功能描述:IC ADC 10-BIT 60MSPS 28-SSOP RoHS:否 类别:集成电路 (IC) >> 数据采集 - 模数转换器 系列:- 产品培训模块:Lead (SnPb) Finish for COTS Obsolescence Mitigation Program 标准包装:2,500 系列:- 位数:12 采样率（每秒）:3M 数据接口:- 转换器数目:- 功率耗散（最大）:- 电压电源:- 工作温度:- 安装类型:表面贴装 封装/外壳:SOT-23-6 供应商设备封装:SOT-23-6 包装:带卷 (TR) 输入数目和类型:- |
| HI5766KCAZ | 功能描述:模数转换器 - ADC A/D 10-BIT 60MSPS 28 SSOP COM TEMP RoHS:否 制造商:Texas Instruments 通道数量:2 结构:Sigma-Delta 转换速率:125 SPs to 8 KSPs 分辨率:24 bit 输入类型:Differential 信噪比:107 dB 接口类型:SPI 工作电源电压:1.7 V to 3.6 V, 2.7 V to 5.25 V 最大工作温度:+ 85 C 安装风格:SMD/SMT 封装 / 箱体:VQFN-32 |
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