参数资料
型号: IDT5T9310NLGI
厂商: INTEGRATED DEVICE TECHNOLOGY INC
元件分类: 时钟及定时
英文描述: 5T SERIES, LOW SKEW CLOCK DRIVER, 10 TRUE OUTPUT(S), 0 INVERTED OUTPUT(S), PQCC40
封装: PLASTIC, QFN-40
文件页数: 9/13页
文件大小: 225K
代理商: IDT5T9310NLGI
INDUSTRIALTEMPERATURERANGE
IDT5T9310
2.5VLVDS1:10CLOCKBUFFERTERABUFFERII
5
DIFFERENTIAL INPUT AC TEST CONDITIONS FOR eHSTL
Symbol
Parameter
Value
Units
VDIF
Input Signal Swing(1)
1V
VX
DifferentialInputSignalCrossingPoint(2)
900
mV
DH
Duty Cycle
50
%
VTHI
InputTimingMeasurementReferenceLevel(3)
CrossingPoint
V
tR, tF
InputSignalEdgeRate(4)
2
V/ns
NOTES:
1. The 1V peak-to-peak input pulse level is specified to allow consistent, repeatable results in an automatic test equipment (ATE) environment. This device meets the VDIF (AC)
specification under actual use conditions.
2. A 900mV crossing point level is specified to allow consistent, repeatable results in an automatic test equipment (ATE) environment. This device meets the VX specification under
actual use conditions.
3. In all cases, input waveform timing is marked at the differential cross-point of the input signals.
4. The input signal edge rate of 2V/ns or greater is to be maintained in the 20% to 80% range of the input waveform.
DIFFERENTIAL INPUT AC TEST CONDITIONS FOR HSTL
Symbol
Parameter
Value
Units
VDIF
Input Signal Swing(1)
1V
VX
DifferentialInputSignalCrossingPoint(2)
750
mV
DH
Duty Cycle
50
%
VTHI
InputTimingMeasurementReferenceLevel(3)
CrossingPoint
V
tR, tF
InputSignalEdgeRate(4)
2
V/ns
NOTES:
1. The 1V peak-to-peak input pulse level is specified to allow consistent, repeatable results in an automatic test equipment (ATE) environment. This device meets the VDIF (AC)
specification under actual use conditions.
2. A 750mV crossing point level is specified to allow consistent, repeatable results in an automatic test equipment (ATE) environment. This device meets the VX specification under
actual use conditions.
3. In all cases, input waveform timing is marked at the differential cross-point of the input signals.
4. The input signal edge rate of 2V/ns or greater is to be maintained in the 20% to 80% range of the input waveform.
DIFFERENTIAL INPUT AC TEST CONDITIONS FOR LVEPECL (2.5V) AND
LVPECL (3.3V)
Symbol
Parameter
Value
Units
VDIF
Input Signal Swing(1)
732
mV
VX
DifferentialInputSignalCrossingPoint(2)
LVEPECL
1082
mV
LVPECL
1880
DH
Duty Cycle
50
%
VTHI
InputTimingMeasurementReferenceLevel(3)
CrossingPoint
V
tR, tF
InputSignalEdgeRate(4)
2
V/ns
NOTES:
1. The 732mV peak-to-peak input pulse level is specified to allow consistent, repeatable results in an automatic test equipment (ATE) environment. This device meets the VDIF (AC)
specification under actual use conditions.
2. 1082mV LVEPECL (2.5V) and 1880mV LVPECL (3.3V) crossing point levels are specified to allow consistent, repeatable results in an automatic test equipment (ATE) environment.
This device meets the VX specification under actual use conditions.
3. In all cases, input waveform timing is marked at the differential cross-point of the input signals.
4. The input signal edge rate of 2V/ns or greater is to be maintained in the 20% to 80% range of the input waveform.
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