参数资料
型号: IDT71V432S6PF
厂商: IDT, Integrated Device Technology Inc
文件页数: 4/18页
文件大小: 0K
描述: IC SRAM 1MBIT 6NS 100TQFP
标准包装: 72
格式 - 存储器: RAM
存储器类型: SRAM - 同步
存储容量: 1M(32K x 32)
速度: 6ns
接口: 并联
电源电压: 3.135 V ~ 3.63 V
工作温度: 0°C ~ 70°C
封装/外壳: 100-LQFP
供应商设备封装: 100-TQFP(14x14)
包装: 托盘
其它名称: 71V432S6PF
IDT71V432, 32K x 32 CacheRAM
3.3V Synchronous SRAM with Burst Counter, Single Cycle Deselect
Commercial and Industrial Temperature Ranges
Absolute Maximum Ratings (1)
Symbol Rating Value
Unit
Recommended Operating
Temperature and Supply Voltage
Grade Temperature V SS V DD
V TERM
V TERM
(2)
(3)
Terminal Voltage with
Respect to GND
Terminal Voltage with
–0.5 to +4.6
–0.5 to V DD +0.5
V
V
Commercial
Industrial
0°C to +70°C
–40°C to +85°C
0V
0V
3.3V+10/-5%
3.3V+10/-5%
Respect to GND
3104 tbl 03
T A
Operating Temperature
0 to +70
o
C
C
C
T BIAS
T STG
P T
Temperature Under Bias
Storage Temperature
Power Dissipation
–55 to +125
–55 to +125
1.0
o
o
W
Recommended DC Operating
Conditions
I OUT
DC Output Current
50
mA
Symbol Parameter
Min.
Typ.
Max.
Unit
4.6
–0.5
3104 tbl 05
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may
cause permanent damage to the device. This is a stress rating only and functional
operation of the device at these or any other conditions above those indicated
in the operational sections of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect reliability.
V DD
V SS
V IH
V IH
V IL
Supply Voltage
Ground
Input High Voltage — Inputs
Input High Voltage — I/O
Input Low Voltage
3.135
0
2.0
2.0
(1)
3.3
0
3.63
0
(2)
V DD +0.3
0.8
V
V
V
V
V
2. V DD and Input terminals only.
3. I/O terminals.
NOTES:
3104 tbl 04
1. V IL (min) = –1.0V for pulse width less than t CYC /2, once per cycle.
2. V IH (max) = 6.0V for pulse width less than t CYC /2, once per cycle.
Capacitance
(T A = +25°C, f = 1.0MHz, TQFP package)
Symbol
C IN
C I/O
Parameter (1)
Input Capacitance
I/O Capacitance
Conditions
V IN = 3dV
V OUT = 3dV
Max.
6
7
Unit
pF
pF
3104 tbl 06
NOTE:
1. This parameter is guaranteed by device characterization, but not production
tested.
6.42
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