参数资料
型号: IDT71V432S6PF
厂商: IDT, Integrated Device Technology Inc
文件页数: 8/18页
文件大小: 0K
描述: IC SRAM 1MBIT 6NS 100TQFP
标准包装: 72
格式 - 存储器: RAM
存储器类型: SRAM - 同步
存储容量: 1M(32K x 32)
速度: 6ns
接口: 并联
电源电压: 3.135 V ~ 3.63 V
工作温度: 0°C ~ 70°C
封装/外壳: 100-LQFP
供应商设备封装: 100-TQFP(14x14)
包装: 托盘
其它名称: 71V432S6PF
IDT71V432, 32K x 32 CacheRAM
3.3V Synchronous SRAM with Burst Counter, Single Cycle Deselect
Commercial and Industrial Temperature Ranges
DC Electrical Characteristics Over the Operating Temperature and
Supply Voltage Range (V DD = 3.3V +10/-5%, Commercial and Industrial Temperature Ranges)
Symbol
|I LI |
Parameter
Input Leakage Current
Test Conditions
V DD = Max., V IN = 0V to V DD
Min.
Max.
5
Unit
μA
|I LI |
|I LO |
V OL
V OH
ZZ and LBO Input Leakage Current
Output Leakage Current
Output Low Voltage (I/O 1 –I/O 31 )
Output High Voltage (I/O 1 –I/O 31 )
(1)
V DD = Max., V IN = 0V to V DD
CE > V IH or OE > V IH , V OUT = 0V to V DD , V DD = Max.
I OL = 5mA, V DD = Min.
I OH = –5mA, V DD = Min.
2.4
30
5
0.4
μA
μA
V
V
NOTE:
3104 tbl 12
1. The LBO pin will be internally pulled to V DD if it is not actively driven in the application and the ZZ pin will be internally pulled to V SS if not actively driven.
DC Electrical Characteristics Over the Operating Temperature and
Supply Voltage Range (1) (V DD = 3.3V +10/-5%, V HD = V DD –0.2V, V LD = 0.2V)
IDT71V432S5
IDT71V432S6
IDT71V432S7
Symbol
I DD
I SB
I SB1
Parameter
Operating Power Supply Current
Standby Power Supply Current
Full Standby Power Supply Current
Test Conditions
Device Selected, Outputs Open, V DD = Max.,
V IN > V IH or < V IL , f = f MAX (2)
Device Deselected, Outputs Open, V DD = Max.,
V IN > V IH or < V IL , f = f MAX (2)
Device Deselected, Outputs Open, V DD = Max.,
V IN > V HD or < V LD , f = 0 (2)
Com'l.
200
65
15
Ind.
200
65
15
Com'l.
180
60
15
Ind.
180
60
15
Com'l.
160
55
15
Ind.
160
55
15
Unit
mA
mA
mA
I ZZ
Full Sleep Mode Power Supply Current ZZ > V HD , V DD = Max.
10
10
10
10
10
10
mA
NOTES:
1. All values are maximum guaranteed values.
2. At f = f MAX, inputs are cycling at the maximum frequency of read cycles of 1/t CYC while ADSC = LOW; f=0 means no input lines are changing.
3104 tbl 13
AC Test Loads
+3.3V
+1.5V
50 ?
I/O
317 ?
I/O
Z 0 = 50 ?
351 ?
5pF*
3104 drw 03
Figure 1. AC Test Load
6
5
4
* Including scope and jig capacitance.
Figure 2. AC Test Load
(for t OHZ , t CHZ , t OLZ , and t DC1)
3104 drw 04
? t CD
(Typical, ns)
3
2
AC Test Conditions
Input Pulse Levels
0 to 3.0V
1
Input Rise/Fall Times
2ns
20 30 50
80 100
Capacitance (pF)
200
Input Timing Reference Levels
1.5V
3104 drw 05
Figure 3. Lumped Capacitive Load, Typical Derating
Output Timing Reference Levels
AC Test Load
1.5V
See Figures 1 and 2
3104 tbl 14
8
6.42
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